Applications from Agilent Technologies - page 1

Benefits of running organic matrices using the Agilent 5100 ICP-OES—fast, robust, high performance analysis

Technical notes

| 2015 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Use of the Agilent Multimode Sample Introduction System (MSIS) for Simultaneous Hydride Determination and Conventional Nebulization Using the PerkinElmer Optima 7/8x00 Series ICP-OES Systems

Technical notes

| 2016 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies, PerkinElmer

Industries

Quantitative analysis using ATR-FTIR Spectroscopy

Technical notes

| 2011 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

DialPath Sampling Accessory

Technical notes

| 2021 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Graphite Tube Atomizer Performance – ASTM Graphite Furnace Round Robin for Water

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Evaluation of the Mark-VI Spray Chamber for Flame Atomic Absorption Spectrometry

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

ATR Sampling Accessories for the Agilent Cary 630 FTIR Spectrometer

Technical notes

| 2022 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Solutions for Children’s Product Testing

Technical notes

| 2010 | Agilent Technologies

GC/MSD, GC/IT, ICP-OES

Instrumentation

GC/MSD, GC/IT, ICP-OES

Manufacturer

Agilent Technologies

Industries

Materials Testing

Nanoparticle Analysis by ICP-MS - Why sensitivity is key

Technical notes

| 2023 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Linearity Limits for Several Trace Metals Currently Determined by Electrothermal Atomic Absorption Spectrometry

Technical notes

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries