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Applications from Agilent Technologies - page 9
WCPS: High Matrix Analysis of As, Se, Cd, Hg, & Pb in Food Digestates Using Inductively Coupled Mass Spectrometry
Posters
| 2011 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
Industries
Food & Agriculture
Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions
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| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS
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| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Energy & Chemicals , Semiconductor Analysis
Agilent ICP-MS Journal (July 2016 – Issue 66)
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| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
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Enhanced Helium Collision Mode with Agilent ORS4 Cell
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| 2020 | Agilent Technologies
ICP/MS
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Agilent Technologies
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Agilent ICP-MS Journal (November 2015 – Issue 63)
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| 2016 | Agilent Technologies
Software, ICP/MS, ICP/MS/MS
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Software, ICP/MS, ICP/MS/MS
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Agilent Technologies
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Environmental
Upgrade Products for Agilent 7500 Series ICP-MS Instruments
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| 2006 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS
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| 2025 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode
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| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
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Agilent Technologies
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Materials Testing
Direct Analysis of Photoresist and Related Solvents Using the Agilent 7500cs ICP-MS
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| 2004 | Agilent Technologies
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ICP/MS
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Agilent Technologies
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Semiconductor Analysis
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