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Applications from Agilent Technologies - page 26
Agilent Cary Universal Measurement Accessory (UMA)
Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
Industries
Measuring the cover and shade protection factors of synthetic shadecloth
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| 2011 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
Industries
Materials Testing
Determination of Heavy Metals and Trace Elements in Alternative Meats Per EAM 4.7 Method for ICP-MS
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| 2022 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Food & Agriculture
Unproductive Time Traps in ICP-MS Analysis and How to Avoid Them
Guides
| 2021 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
Industries
Routine Analysis of Soils using ICP-MS and Discrete Sampling
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| 2021 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Environmental
Agilent ICP-MS Journal (October 2018. Issue 74)
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| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS, Laser ablation
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ICP/MS, ICP/MS/MS, Laser ablation
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Agilent Technologies
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Environmental
WCPS: Determination of Heavy Metals and Nutrient Elements in Alternative Protein Foods Using ICP-MS
Posters
| 2023 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies, CEM
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Food & Agriculture
Performance Attributes of the Agilent 8700 Laser Direct Infrared (LDIR) Chemical Imaging System
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| 2022 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
Industries
Environmental
Conformational Studies Using Second Derivative UV-Vis Absorption Spectroscopy
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| 2020 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
Industries
Pharma & Biopharma
WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS
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| 2018 | Agilent Technologies
Sample Preparation, ICP/MS, ICP/MS/MS
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Sample Preparation, ICP/MS, ICP/MS/MS
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Agilent Technologies, Elemental Scientific
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Energy & Chemicals , Semiconductor Analysis
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