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Applications from Agilent Technologies - page 16
ICP-OES Productivity Package
Technical notes
| 2013 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Dedicated axial or radial plasma view for superior speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
True simultaneous ICP-OES for unmatched speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
CCD and CID solid-state detectors
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Agilent 8800 Triple Quadrupole ICP-MS: Understanding oxygen reaction mode in ICP-MS/MS
Technical notes
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Comparing the limiting resolution of the Agilent Cary 5000 and Cary 6000i UVVis-NIR spectrophotometers using the transmission spectrum of water vapor
Technical notes
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
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