Applications from Agilent Technologies - page 12

WCPS: Analysis Of Wear Metals In Lubricating Oils By Microwave Plasma - Atomic Emission Spectrometry

Posters
| 2012 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Agilent ICP-MS Journal (February 2014 – Issue 56)

Others
| 2014 | Agilent Technologies
Software, ICP/MS
Instrumentation
Software, ICP/MS
Manufacturer
Agilent Technologies
Industries

Applications of ICP-MS in Homeland Security

Technical notes
| 2004 | Agilent Technologies
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Homeland Security

WCPS: Trace Level Analysis of V, As and Se Using He Cell Gas via Kinetic Energy Discrimination and Collisional Dissociation in Acidic Matrices

Posters
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries

Determination of V, Ni, and Fe in Crude Oils and Bitumen using Sequential ICP-OES and Scandium as an Internal Standard

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Ultra-fast ICP-OES determinations of soil and plant material using next generation sample introduction technology

Applications
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies, CEM
Industries
Environmental

Ultra-fast ICP-OES determination of trace elements in water, conforming to US EPA 200.7 and using next generation sample introduction technology

Applications
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

Ultra-fast ICP-OES determinations of base metals in geochemical samples using next generation sample introduction technology

Applications
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

Agilent 7900s ICP-MS for Semiconductor Applications

Others
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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