Direct Analysis of Undiluted Soil Digests Using the Agilent High Matrix Introduction Accessory with the 7500cx ICP-MS
Presentations
| 2008 | Agilent Technologies (Pittcon)
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Single Nanoparticle Analysis of Asphaltene Solutions using ICP-QQQ
Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Determination of Extractable and Leachable Elements Using ICP-MS
Applications
| 2022 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS
Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Ultra High Matrix Introduction (UHMI)
Technical notes
| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ
Applications
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Agilent ICP-MS Journal (February 2010 – Issue 41)
Others
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma, Clinical Research
Direct, Rapid Analysis of Undiluted Seawater using ICP-MS with an Aerosol Dilution System
Posters
| N/A | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell