Applications from the field of Materials Testing | LabRulez ICPMS

Optical Characterization of Thin Films

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Applications

| 2018 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Quality Control of Beam Splitters and Quarter-Wave-Mirrors

Technical notes

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Optical Characteristics and Thickness of 2-layered Structures

Applications

| 2018 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Handheld FTIR spectroscopy applications using the Agilent ExoScan 4100 FTIR with diffuse sample interface

Applications

| 2011 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample

Applications

| 2021 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

EDXRF Analysis of Polymer Film

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Void Analysis and Shape Analysis of Automobile Inverter Components with X-Ray CT System

Applications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

Optical Characterization of Thin Films

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Quality Control of Beam Splitters and Quarter-Wave-Mirrors

Optical Characteristics and Thickness of 2-layered Structures

The determination of thin film thickness using reflectance spectroscopy

Handheld FTIR spectroscopy applications using the Agilent ExoScan 4100 FTIR with diffuse sample interface

Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

EDXRF Analysis of Polymer Film

Void Analysis and Shape Analysis of Automobile Inverter Components with X-Ray CT System

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