Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards
Applications
| 2018 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Quality Control of Beam Splitters and Quarter-Wave-Mirrors
Technical notes
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Optical Characteristics and Thickness of 2-layered Structures
Applications
| 2018 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
The determination of thin film thickness using reflectance spectroscopy
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Handheld FTIR spectroscopy applications using the Agilent ExoScan 4100 FTIR with diffuse sample interface
Applications
| 2011 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample
Applications
| 2021 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
EDXRF Analysis of Polymer Film
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Direct Identification of Packaged Substances using the Agilent Resolve Handheld Raman Analyzer