Applications from the field of Materials Testing | LabRulez ICPMS
WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS
Posters
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Materials Testing
A Practical Guide To Elemental Analysis of Lithium Ion Battery Materials Using ICP-OES
Guides
| 2023 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing
Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer
Applications
| 2016 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Materials Testing
FIELD-FLOW FRACTIONATION WITH SINGLE PARTICLE ICP-MS AS AN ONLINE DETECTOR
Others
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
Speciation Applications Summary Ion Chromatography
ANALYSIS OF EXTRACTABLE AND LEACHABLE METALS IN PLASTIC MATERIALS OF CONSTRUCTION AS PER USP <661.1> ACID EXTRACTION PROCEDURE USING THE AGILENT 5110 VDV ICP-OES
Applications
| 2016 | Agilent Technologies
LC/Orbitrap, ICP/OES
Instrumentation
LC/Orbitrap, ICP/OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Analysis of steel and its alloys using the GB/T 20125-2006 standard and an Agilent 5100 ICP-OES in dual view mode
Applications
| 2015 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing
The Migration of Elements from Toys and Speciation of Chromium (VI) in Toy Material Using a Low Cost IC-ICP-MS Solution
Applications
| 2016 | Thermo Fisher Scientific
Ion chromatography
Instrumentation
Ion chromatography
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing
High sensitivity analysis of SiO2 nanoparticles using the Agilent 8900 ICP-QQQ in MS/MS mode