Applications from the field of Materials Testing - page 81

Surface Carbon on Steel Sheet and Rod Samples

Applications

| 2008 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Agilent ICP-MS Journal (April 2008 – Issue 34)

Others

| 2008 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing

Pseudo Elements: Use, Format, Example, Explanation & Discussion

Technical notes

| 2008 | LECO

GD/MP/ICP-AES, Elemental Analysis, Software

Instrumentation

GD/MP/ICP-AES, Elemental Analysis, Software

Manufacturer

LECO

Industries

Materials Testing

Hydrogen Determination in Reactive and Refractory Metals*

Applications

| 2008 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

The DXR Raman Microscope for High-Performance Raman Microscopy

Applications

| 2008 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy, Software

Instrumentation

RAMAN Spectroscopy, Microscopy, Software

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Microscope Mapping on Formulated Pharmaceutical Samples Using the Dispersive Raman Technique

Applications

| 2008 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Angle Resolved XPS

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Errors Associated With Thin Film Measurements Using XPS at a Single Angle

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Method for Charge Compensation on Sigma Probe, Theta Probe and Theta 300

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing