Applications from the field of Materials Testing - page 4

Analysis of ITO and h-BN thin films using GIXRD on ARL X’TRA Companion X-ray Diffractometer

Applications

| 2025 | Thermo Fisher Scientific

XRD

Instrumentation

XRD

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Multi-technique composition, coverage and band gap analysis of ALD-grown ultra thin films

Applications

| 2020 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Characterization of High-k Dielectric Materials on Silicon Using Angle Resolved XPS

Applications

| 2008 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Sample Stages Overview XRDynamic 500

Brochures and specifications

| 2024 | Anton Paar

XRD, Consumables

Instrumentation

XRD, Consumables

Manufacturer

Anton Paar

Industries

Materials Testing

Studying the homogeneity of tourmalines with the ARL QUANT’X EDXRF Spectrometer

Applications

| 2022 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Energy & Chemicals

Evaluating Silicon using Raman Microscopy

Applications

| 2024 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Determining the origin and authenticity of gemstones with ARL QUANT’X EDXRF Spectrometer

Applications

| 2023 | Thermo Fisher Scientific

X-ray

Instrumentation

X-ray

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing

Measuring the reflective properties of architectural glass using the Agilent Cary 630 FTIR with 10 degree Specular Refl ectance Accessory

Applications

| 2013 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Quantitative Depth Profile (QDP) Analysis of NIST 2135c - Ni/Cr Thin Film Depth Profile Standard

Applications

| 2010 | LECO

GD/MP/ICP-AES, Elemental Analysis

Instrumentation

GD/MP/ICP-AES, Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing