Applications from the field of Materials Testing | LabRulez ICPMS

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Applications

| 2022 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ

Posters

| 2017 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Laser Ablation (LA)-ICP-MS for Production Control of Nickel Alloys

Applications

| 2005 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Materials Testing

Optical Characteristics and Thickness of 2-layered Structures

Applications

| 2018 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Improving Spectral Quality Using Beam Collimation Control

Technical notes

| 2024 | Agilent Technologies

UV–VIS spectrophotometry, NIR Spectroscopy

Instrumentation

UV–VIS spectrophotometry, NIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Transmission Measurements of Solid Samples at Variable Angles of Incidence by UV-Vis

Applications

| 2024 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module

Applications

| 2015 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing

Agilent RapID Raman

Brochures and specifications

| 2020 | Agilent Technologies

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from the field of Materials Testing | LabRulez ICPMS

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ

Laser Ablation (LA)-ICP-MS for Production Control of Nickel Alloys

Optical Characteristics and Thickness of 2-layered Structures

Improving Spectral Quality Using Beam Collimation Control

Transmission Measurements of Solid Samples at Variable Angles of Incidence by UV-Vis

Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module

Agilent RapID Raman

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