Applications from the field of Materials Testing focused on UV–VIS spectrophotometry from Agilent Technologies | LabRulez ICPMS

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Measuring the Optical Properties of Photovoltaic Cells

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Optical Characterization of Thin Films

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring the reflectance of very small samples using the Agilent Cary 60 Remote Diffuse Reflectance Accessory (DRA)

Applications

| 2012 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Applications

| 2013 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Measuring the UV protection factor (UPF) of fabrics and clothing

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Applications from the field of Materials Testing focused on UV–VIS spectrophotometry from Agilent Technologies | LabRulez ICPMS

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Measuring the Optical Properties of Photovoltaic Cells

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Optical Characterization of Thin Films

Measuring the reflectance of very small samples using the Agilent Cary 60 Remote Diffuse Reflectance Accessory (DRA)

Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Measuring the UV protection factor (UPF) of fabrics and clothing

Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500

The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Related content

V4+ Conference on Environment and Health in Central Europe

Detecting nanoplastics – in fractions of a second

The U.S. Pharmacopeia (USP) and Mestrelab Research, S.L. (Mestrelab), are pleased to announce they have entered into a collaboration to deliver USP-ID, through Mestrelab’s Mnova platform.