Applications from the field of Energy & Chemicals | LabRulez ICPMS
Improved Performance for the Analysis of Aromatics in Gasoline by ASTM Method D5769 Using the Agilent 5973 inert Gas Chromatography/Mass Spectrometry System
Applications
| 2003 | Agilent Technologies
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Natural Gas Analysis: A Simplified Approach for the Analysis of Permanent Gases and Hydrocarbons in Natural Gas by Capillary Chromatography and Deans Switch
Applications
| 2012 | Agilent Technologies
GC
Instrumentation
GC
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Increased Instrument Uptime with Improved Methanizer for Dissolved Gas Analysis
Applications
| 2021 | ARC
GC
Instrumentation
GC
Manufacturer
Agilent Technologies, ARC
Industries
Energy & Chemicals
Versatile Automated Pyrolysis GC Combining a Filament Type Pyrolyzer with a Thermal Desorption Unit
Applications
| 2011 | GERSTEL
GC/MSD, Thermal desorption, GC/SQ
Instrumentation
GC/MSD, Thermal desorption, GC/SQ
Manufacturer
Agilent Technologies, GERSTEL
Industries
Environmental, Energy & Chemicals , Materials Testing
Design, Performance and Applicability of a Multi-Functional Thermodesorption System for Trace Analysis in Capillary GC
Applications
| 1994 | GERSTEL
GC/MSD, Thermal desorption, GC/SQ
Instrumentation
GC/MSD, Thermal desorption, GC/SQ
Manufacturer
Agilent Technologies, GERSTEL
Industries
Environmental, Energy & Chemicals
Design and Evaluation of A Capillary GC Analyzer for Automated Simultaneous Analysis of Permanent Gases and Light Hydrocarbons in Natural Gases
Applications
| 1994 | GERSTEL
GC
Instrumentation
GC
Manufacturer
Agilent Technologies, GERSTEL
Industries
Energy & Chemicals
Refinery Gas Analysis by Gas Chromatography
Brochures and specifications
| N/A | Wasson-ECE Instrumentation
GC
Instrumentation
GC
Manufacturer
Wasson-ECE Instrumentation, Agilent Technologies
Industries
Energy & Chemicals
5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selective-Ion Monitoring Modes