Thermo Scientific ICP-MS solutions for the semiconductor industry
Brochures and specifications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Lowering the Cost of Fluoropolymer Components in Semiconductor Manufacturing
Technical notes
| 2021 | Savillex
Consumables
Instrumentation
Consumables
Manufacturer
Savillex
Industries
Semiconductor Analysis
Meeting the new semiconductor market requirements in high-purity aluminum analysis with ARL iSpark 8860 OES Analyzer
Applications
| 2020 | Thermo Fisher Scientific
Optical Emission Spectroscopy (OES)
Instrumentation
Optical Emission Spectroscopy (OES)
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Semiconductor Analysis
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
Applications
| 2014 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS
Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Agilent ICP-MS Journal (March 2012 – Issue 49)
Others
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Multi-Elemental Analysis of Lithium Aluminum Titanium Phosphate by Automated ICP-OES