Applications from the field of Semiconductor Analysis - page 1

Detection of molecular ions from OLED material using AccuTOF GC

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

JEOL

Industries

Materials Testing, Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR

Applications

| 2018 | Shimadzu

GC/MSD, Pyrolysis, GC/SQ

Instrumentation

GC/MSD, Pyrolysis, GC/SQ

Manufacturer

Shimadzu, Frontier Lab

Industries

Materials Testing, Semiconductor Analysis

Online monitoring of sulfuric acid and hydrogen peroxide using Raman spectroscopy

Applications

| 2023 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Semiconductor Analysis

Evaluating Silicon using Raman Microscopy

Applications

| 2024 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Routine analysis of 7N high purity gallium phosphide by Glow Discharge Mass Spectrometry

Applications

| 2025 | Thermo Fisher Scientific

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Infrared Photoluminescence Spectroscopy

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Materials Testing, Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Studying nickel deposition with EQCM-D and EC-Raman

Applications

| 2026 | Metrohm

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Instrumentation

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Manufacturer

Metrohm

Industries

Semiconductor Analysis