Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS
Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples
Posters
| 2020 | Agilent Technologies (ASMS)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
A Dynamic Lab Servicing the Semiconductor Industry
Others
| 2022 | Savillex
Sample Preparation, Consumables
Instrumentation
Sample Preparation, Consumables
Manufacturer
Savillex
Industries
Semiconductor Analysis
Agilent 7900s ICP-MS for Semiconductor Applications
Others
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Routine determination of ultratrace elements in semiconductor grade nitric acid by the Thermo Scientific iCAP RQ ICP-MS