Applications from the field of Semiconductor Analysis | LabRulez ICPMS

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS

Applications

| 2021 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes

| 2010 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Online monitoring of sulfuric acid and hydrogen peroxide using Raman spectroscopy

Applications

| 2023 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Quality Control of Laminates

Applications

| 2021 | Metrohm

NIR Spectroscopy

Instrumentation

NIR Spectroscopy

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Agilent ICP-MS Journal (April 2018. Issue 72)

Others

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Food & Agriculture, Semiconductor Analysis

Agilent ICP-MS Journal (July 2017 – Issue 69)

Others

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Pharma & Biopharma, Semiconductor Analysis

Applications from the field of Semiconductor Analysis | LabRulez ICPMS

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Online monitoring of sulfuric acid and hydrogen peroxide using Raman spectroscopy

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

Quality Control of Laminates

Agilent ICP-MS Journal (April 2018. Issue 72)

Agilent ICP-MS Journal (July 2017 – Issue 69)

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