Applications from the field of Semiconductor Analysis - page 1

WCPS: The Analysis and Stability of High Purity TetraMethylAm m onium Hyrdoxide (TMAH) with the Agilent 8900 QQQ-ICPMS

Posters
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS

Applications
| 2025 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Consumable Solutions for Semiconductor Analysis

Brochures and specifications
| 2025 | Agilent Technologies
ICP/MS/MS, ICP/MS
Instrumentation
ICP/MS/MS, ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Carbon and Oxygen Quantification in Silicon wafers

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Guides
| 2020 | Agilent Technologies
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Instrumentation
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

iCAP TQ ICP-MS Applications Compendium

Guides
| 2019 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS, Sample Preparation, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Sample Preparation, Laser ablation
Manufacturer
Thermo Fisher Scientific, Elemental Scientific
Industries
Pharma & Biopharma, Forensics , Clinical Research, Semiconductor Analysis , Food & Agriculture, Energy & Chemicals , Environmental, Materials Testing
Other projects
GCMS
LCMS
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