Applications from the field of Semiconductor Analysis - page 1

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Semiconductor Analysis

Infrared Photoluminescence Spectroscopy

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Materials Testing, Semiconductor Analysis

Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS

Applications

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Applications

| 2015 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Carbon and Oxygen Quantification in Silicon wafers

Applications

| 2021 | Bruker Optics

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Bruker

Industries

Semiconductor Analysis

Agilent ICP-MS Journal (November 2021, Issue 86)

Others

| 2021 | Agilent Technologies

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Instrumentation

Ion chromatography, IC-MS, ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies, Metrohm, CEM

Industries

Environmental, Food & Agriculture, Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Ultratrace measurement of calcium in ultrapure water using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2012 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS

Applications

| 2025 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis