Menu
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
Applications from the field of Semiconductor Analysis - page 3
Agilent ICP-MS Journal (April 2018. Issue 72)
Others
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture, Semiconductor Analysis
Analysis of Electroceramics by Laser Ablation ICP-MS
Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode
Applications
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Studying nickel deposition with EQCM-D and EC-Raman
Applications
| 2026 | Metrohm
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Instrumentation
RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry
Manufacturer
Metrohm
Industries
Semiconductor Analysis
A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products
Brochures and specifications
| 2026 | Agilent Technologies
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Instrumentation
GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS
Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Trace Elemental Analysis of Precursor Materials Using ICP-MS/MS
Applications
| 2025 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Eastern Analytical Symposium & Exposition 2023 Abstract Book
Others
| 2023 | EAS
HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Microscopy, RAMAN Spectroscopy
Instrumentation
HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Microscopy, RAMAN Spectroscopy
Manufacturer
Industries
Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing
Eastern Analytical Symposium & Exposition 2025 Preliminary Program
Others
| 2025 | EAS
HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Capillary electrophoresis, Software, Microscopy, MS Imaging, MALDI
Instrumentation
HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Capillary electrophoresis, Software, Microscopy, MS Imaging, MALDI
Manufacturer
Industries
Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing
Other projects
Follow us
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike