Applications from the field of Semiconductor Analysis - page 2

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

Agilent ICP-MS Journal (July 2017 – Issue 69)

Others
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Pharma & Biopharma, Semiconductor Analysis

Evaluation of TOC of Sulfuric Acid using Wet Oxidation TOC Analyzer

Applications
| 2024 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Energy & Chemicals , Semiconductor Analysis

WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

Posters
| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy

Applications
| 2009 | Thermo Fisher Scientific
RAMAN Spectroscopy, Microscopy
Instrumentation
RAMAN Spectroscopy, Microscopy
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing, Semiconductor Analysis

Raman Spectroscopy: Deciphering the Structural Dynamics of 2D Semiconductors

Applications
| 2025 | Thermo Fisher Scientific
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Reaching sub-ppm limits of detection for carbon, nitrogen and oxygen with the Element GD Plus GD-MS

Applications
| 2023 | Thermo Fisher Scientific
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS

Posters
| 2018 | Agilent Technologies
Sample Preparation, ICP/MS, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Energy & Chemicals , Semiconductor Analysis

Eastern Analytical Symposium & Exposition 2025 Preliminary Program

Others
| 2025 | EAS
HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Capillary electrophoresis, Software, Microscopy, MS Imaging, MALDI
Instrumentation
HPLC, Consumables, LC columns, NMR, Pyrolysis, GC/MSD, GCxGC, 2D-LC, LC/MS, FTIR Spectroscopy, GC/MS/MS, GC/QQQ, LC/MS/MS, LC/QQQ, GC, SFC, Ion Mobility, Capillary electrophoresis, Software, Microscopy, MS Imaging, MALDI
Manufacturer
Industries
Forensics , Environmental, Pharma & Biopharma, Semiconductor Analysis , Clinical Research, Proteomics , Food & Agriculture, Lipidomics, Materials Testing

WCPS: AGILENT 8800 TRIPLE QUADRUPOLE ICP-MS WINTER PLASMA CONFERENCE 2012 POSTERS

Posters
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike