Applications from the field of Semiconductor Analysis - page 2

Agilent ICP-MS Journal (July 2017 – Issue 69)

Others

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Pharma & Biopharma, Semiconductor Analysis

Evaluation of TOC of Sulfuric Acid using Wet Oxidation TOC Analyzer

Applications

| 2024 | Shimadzu

TOC

Instrumentation

TOC

Manufacturer

Shimadzu

Industries

Energy & Chemicals , Semiconductor Analysis

WCPS: Ultratrace Analysis of Phosphorus, Boron and Other Impurities in Photovoltaic Silicon and Trichlorosilane by ICP-MS with High Energy Collision Cell

Posters

| 2011 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Characterization of Amorphous and Microcrystalline Silicon using Raman Spectroscopy

Applications

| 2009 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Raman Spectroscopy: Deciphering the Structural Dynamics of 2D Semiconductors

Applications

| 2025 | Thermo Fisher Scientific

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Reaching sub-ppm limits of detection for carbon, nitrogen and oxygen with the Element GD Plus GD-MS

Applications

| 2023 | Thermo Fisher Scientific

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

WCPS: Determination of Ultra Trace Elements in High Purity Reagents by Automatic Standard Addition Methods Using prepFAST S - ICP-MS/MS

Posters

| 2018 | Agilent Technologies

Sample Preparation, ICP/MS, ICP/MS/MS

Instrumentation

Sample Preparation, ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Energy & Chemicals , Semiconductor Analysis

WCPS: AGILENT 8800 TRIPLE QUADRUPOLE ICP-MS WINTER PLASMA CONFERENCE 2012 POSTERS

Posters

| 2012 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Semiconductor Analysis

Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS

Applications

| 2021 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis