Applications from the field of Semiconductor Analysis - page 10

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Evaluating Silicon using Raman Microscopy

Applications

| 2024 | Thermo Fisher Scientific

RAMAN Spectroscopy, Microscopy

Instrumentation

RAMAN Spectroscopy, Microscopy

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Agilent 7900s ICP-MS for Semiconductor Applications

Others

| 2020 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Raman Spectroscopy: Deciphering the Structural Dynamics of 2D Semiconductors

Applications

| 2025 | Thermo Fisher Scientific

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Ultratrace measurement of calcium in ultrapure water using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2012 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of ultratrace elements in semiconductor grade Isopropyl Alcohol using the Thermo Scientific iCAP RQ ICP-MS

Applications

| 2017 | Thermo Fisher Scientific

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Evaluation of TOC of Sulfuric Acid using Wet Oxidation TOC Analyzer

Applications

| 2024 | Shimadzu

TOC

Instrumentation

TOC

Manufacturer

Shimadzu

Industries

Energy & Chemicals , Semiconductor Analysis

WCPS: Accurate determination of Eu, and Sm in ultra-pure barium carbonate materials by ICP-QQQ

Posters

| 2017 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis