Applications from the field of Environmental | LabRulez ICPMS
Analyze Seven EPA Methods on One GC Column Pair!
Applications
| 2016 | Restek
GC, GC columns, Consumables
Instrumentation
GC, GC columns, Consumables
Manufacturer
Agilent Technologies, Restek
Industries
Environmental
Automated sample preparation methods for mixing and centrifugation
Posters
| N/A | Anatune
GC/MSD, Sample Preparation, GC/SQ
Instrumentation
GC/MSD, Sample Preparation, GC/SQ
Manufacturer
Agilent Technologies, GERSTEL, Anatune
Industries
Environmental, Pharma & Biopharma
Using Nitrogen Purge Gas for US EPA Drinking Water Methods
Applications
| 2012 | Tekmar Teledyne
GC/MSD, Purge and Trap, GC/SQ
Instrumentation
GC/MSD, Purge and Trap, GC/SQ
Manufacturer
Agilent Technologies, Tekmar Teledyne
Industries
Environmental
Using Alternative Carrier Gases for US EPA VOC Drinking Water Methods
Applications
| 2013 | Tekmar Teledyne
GC/MSD, Purge and Trap, GC/SQ
Instrumentation
GC/MSD, Purge and Trap, GC/SQ
Manufacturer
Agilent Technologies, Tekmar Teledyne
Industries
Environmental
Optimization Techniques for Performance of USEPA Methods 5030, 5035, and Determinative Methods 524.2 and 8260 utilizing the Atomx Concentrator/Multimatrix Autosampler and an Agilent 7890A GC and 5975 inert XL MSD
Applications
| 2009 | Tekmar Teledyne
GC/MSD, Purge and Trap, GC/SQ
Instrumentation
GC/MSD, Purge and Trap, GC/SQ
Manufacturer
Agilent Technologies, Tekmar Teledyne
Industries
Environmental
Fast, Optimized GC Purge-and-Trap Analysis of Volatiles for Soil and Water Methods
Applications
| 2018 | Restek
GC/MSD, Purge and Trap, GC/SQ, Consumables
Instrumentation
GC/MSD, Purge and Trap, GC/SQ, Consumables
Manufacturer
Agilent Technologies, Restek, OI Analytical, EST Analytical
Industries
Environmental
Improving the Analysis of Organotin Compounds Using Retention Time Locked Methods and Retention Time Databases
Applications
| 2003 | Agilent Technologies
GC/MSD, GC/SQ
Instrumentation
GC/MSD, GC/SQ
Manufacturer
Agilent Technologies
Industries
Environmental
5973 Inert Performance Electronics: Considerations for GC/MS Methods in Scan and Selective-Ion Monitoring Modes