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Applications from the field of Environmental | LabRulez ICPMS
Compact, portable, and handheld FTIR solutions for solid and liquid analysis
Others
| 2019 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Environmental, Materials Testing
Agilent ICP-MS Journal (Issue 12, April 2002)
Others
| 2002 | Agilent Technologies
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies
Industries
Environmental
Flame Atomic Absorption Spectroscopy (Method Development ePrimer)
Guides
| 2021 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Energy & Chemicals
Resolution of 176 Yb and 176 Lu interferences on 176 Hf to enable accurate 176 Hf/177 Hf isotope ratio analysis using ICP-QQQ with MS/MS
Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Measuring Multiple Elements in Nanoparticles using spICP-MS
Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Materials Testing, Others
Agilent ICP-MS Journal (May 2016 – Issue 65)
Others
| 2016 | Agilent Technologies
Software, Speciation analysis, Laser ablation, ICP/MS, Elemental Analysis
Instrumentation
Software, Speciation analysis, Laser ablation, ICP/MS, Elemental Analysis
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture
Agilent ICP-MS Journal (November 2015 – Issue 63)
Others
| 2016 | Agilent Technologies
Software, ICP/MS, ICP/MS/MS
Instrumentation
Software, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
WCPS: AGILENT 8800 TRIPLE QUADRUPOLE ICP-MS WINTER PLASMA CONFERENCE 2012 POSTERS
Posters
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike