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In-situ Microscopy Alliance
In-situ Microscopy Alliance (IMA) is a community of experts in electron microscopy and complementary analytical techniques with the goal of advancing technology and moving towards a sustainable future. The alliance is driven by analytical in-situ equipment producers and is supported by leading scientists working on sustainable materials, efficient energy storage solutions, and advanced semiconductors. IMA will host webinars and workshops about new techniques and specific applications, as well as provide opportunities for academic and industrial collaborations and networking.

In-Situ Microscopy Alliance Workshop @MIT

25 - 25. April 2024
Learn more about In-Situ SEM Microscopy techniques and join us for two exclusive workshops brought to you by the In-situ Microscopy Alliance, of which NenoVision stands as one of the founding members. We'd love for you to join us and dive into the world of microscopy and be a part of these events!
For more information click here
In-Situ Microscopy Alliance: USA Workshop

In-Situ Microscopy Alliance: USA Workshop

This 1-day workshop is a unique opportunity to meet In-situ Microscopy Alliance: Alemnis, Imina, Nenovison and point electronic. You will learn about existing in-situ solutions, including integrations for correlative in-situ SEM analysis (nanoindentation + electrical nanoprobing, electrical failure analysis, AFM-in-SEM, etc) and hear about applications from the users.

Number of participants is limited to 40.

> Register here

Tentative Program

09:00 - 09:45 | Registration and Coffee
09:45 - 10:00 | Introduction of the In-situ Microscopy Alliance (IMA)
10:00 - 10:30 | Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis
10:30 - 11:00 | Mechanics of architected materials through the lens of in situ characterization, Prof. Carlos Portela, MIT
11:00 - 11:15 | Break and networking
11:15 - 11:45 | Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies
11:45 - 12:15 | User presentation
12:15 - 13:30 | Lunch
13:30 - 14:00 | AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Mr. Jan Neuman, NenoVision
14:00 - 14:30 | Benefits of AFM-in-SEM for applications in material science and battery research, Mr. Jan Neuman, NenoVision
14:30 | End of the seminar, open discussion

Another workshop will be held on Apr. 23, 2024 from 09:00 to 15:30 PST in Covalent Metrology, Sunnyvale, CA, USA

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