In-Situ Microscopy Alliance Workshop @Covalent Metrology
23 - 23. April 2024
For more information click here
In-Situ Microscopy Alliance: USA Workshop
This 1-day workshop is a unique opportunity to meet In-situ Microscopy Alliance: Alemnis, Imina, Nenovison and point electronic. You will learn about existing in-situ solutions, including integrations for correlative in-situ SEM analysis (nanoindentation + electrical nanoprobing, electrical failure analysis, AFM-in-SEM, etc) and hear about applications from the users.
Number of participants is limited to 30.
> Register here
Tentative Program
09:00 - 09:45 | Registration and Coffee
09:45 - 10:00 | Introduction of Covalent Metrology and the In-situ Microscopy Alliance (IMA)
10:00 - 10:30 | Recent innovation in small-scale in-situ mechanical properties testing, Dr. Nicholas Randall, Alemnis
10.30 – 11.00 | Investigating Fracture Toughness of Architected Materials at the Micro-scale, Mr. Abdulaziz Alrashed, University of Washington
11:00 - 11:15 | Break and networking
11:15 - 11:45 | Latest updates in electro-optical characterizations and failure analysis, Mr. Karl Boche, Imina Technologies
11:45 - 12:15 | User presentation
12:15 - 13:30 | Lunch
13:30 - 14:00 | AFM-in-SEM - step forward for in-situ correlative microscopy, technology and applications, Mr. Jan Neuman, NenoVision
14:00 - 14:30 | Benefits of AFM-in-SEM for applications in material science and battery research, Mr. Jan Neuman, NenoVision
14:30 - 15:30 | Lab tour, open discussion, end of the seminar
Another workshop will be held on Apr. 25, 2024 from 09:00 to 14:30 EST in Massachusetts Institute of Tech. (MIT), Boston, MA, USA
In-situ Microscopy Alliance