<h3>Introduction</h3><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Fisher_Scientific_From_Raw_Signals_to_Reliable_Results_Post_Acquisition_Data_Workflows_in_ICP_Analysis_f7248bb920.jpg" alt="Thermo Fisher Scientific: From Raw Signals to Reliable Results: Post-Acquisition Data Workflows in ICP Analysis" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Fisher_Scientific_From_Raw_Signals_to_Reliable_Results_Post_Acquisition_Data_Workflows_in_ICP_Analysis_f7248bb920.jpg 245w," sizes="100vw" width="1024" height="512">Modern elemental analysis techniques such as ICP-OES and ICP-MS are capable of generating large volumes of highly sensitive, multi-dimensional data in a single analytical run. These technologies are widely used across environmental, pharmaceutical, food, and materials science applications due to their precision and low detection limits. However, while significant emphasis is often placed on method development, instrument optimisation, and sample preparation, the true scientific value of any analysis is ultimately determined during the post-acquisition phase. It is here that raw instrumental signals are processed, interrogated, and validated before being translated into meaningful and defensible results. Whether you are working with the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=227&amp;instrumentationItems=84&amp;manufacturerItems=3&amp;search=iCAP+PRO">iCAP PRO ICP-OES</a>, the&nbsp;<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products?category=232&amp;manufacturerItems=3&amp;search=iCAP+MX">iCAP MX ICP-MS</a>, the iCAP 7000 OES, or Qnova ICP-MS systems, the interface and workflow logic remain familiar.<h3>Method</h3>Following data acquisition, analysts must first navigate and organise complex datasets efficiently. Large analytical sequences may contain hundreds of samples, each with multiple analytes, replicates, and quality control elements. Tools such as column sorting and filtering are therefore essential for structured data interrogation. Sorting concentration values, for example, allows rapid identification of extreme values or potential outliers, while filtering by sample type, QC category, or analyte enables targeted investigation of specific data subsets. These tools support not only workflow efficiency but also statistical awareness, helping analysts detect trends, inconsistencies, or anomalies that may otherwise go unnoticed. In parallel, maintaining a complete LabBook history ensures that all changes to methods, calibration parameters, and analytical settings are recorded. This level of traceability is essential for regulatory compliance, particularly in environments operating under ISO standards or Good Laboratory Practice, and it ensures that results can be reproduced and audited with confidence.A fundamental aspect of post-acquisition processing is the application and evaluation of correction models. ICP-based techniques are inherently susceptible to a range of interferences, including background signals, spectral overlaps, and matrix-induced signal suppression or enhancement. Blank subtraction is typically the first correction applied, removing contributions from reagents, solvents, and instrument background. By comparing results with and without blank correction, analysts can assess the significance of background contributions, particularly at low concentration levels. In ICP-OES, Inter-element correction (IEC) addresses spectral interferences by mathematically compensating for overlapping emission lines, which is especially important in complex matrices containing multiple elements.&nbsp;For ICP-MS, correction equations can be similarly implemented to correct for the presence of an isobaric interferences of mass signals.Internal standard (IS) correction is another critical component, used to normalise signal fluctuations caused by instrument drift, variations in sample introduction, or matrix effects. Reviewing data with these corrections toggled on and off provides valuable diagnostic insight, allowing analysts to determine whether corrections are appropriate and whether the underlying method is robust.While processed concentration data is the primary output of most analyses, deeper insight can be gained by examining the underlying signal intensities. Replicate measurements, for instance, provide a direct assessment of analytical precision. Consistent replicate signals indicate stable measurement conditions, whereas significant variation may suggest issues such as sample heterogeneity, nebuliser instability, or matrix interference. Similarly, blank intensities can reveal contamination or insufficient rinsing between samples, often serving as an early indicator of systematic error. In ICP-OES, spectral sub-array views allow analysts to visualise the emission profile around a selected wavelength, enabling verification of peak shape, background correction points, and potential spectral overlaps. In ICP-MS, attention must be given to detector behaviour, particularly when signals transition between pulse and analog modes at higher concentrations. Such transitions can introduce non-linearity into calibration curves, sometimes necessitating cross-calibration to maintain quantitative accuracy.Calibration is central to transforming raw signal intensity into quantitative concentration data, and its evaluation is one of the most critical steps in the workflow. Several performance indicators are used to assess calibration quality. The coefficient of determination (R²) provides a measure of how well the calibration model fits the data, though a high R² alone does not guarantee accuracy. Bias offers insight into systematic deviations between expected and measured values, highlighting potential issues with standards or instrument response. Detection limits, including the limit of detection (LOD) and instrument detection limit (IDL), define the sensitivity of the method, while background equivalent concentration (BEC) reflects the contribution of background signal to the overall measurement. A comprehensive calibration assessment requires consideration of all these parameters together, rather than reliance on a single metric. In addition, quality control samples—such as calibration check standards (CCVs), certified reference materials (CRMs), and matrix spikes—are used to verify accuracy and method performance. Automated flagging of QC results that fall outside predefined acceptance criteria provides an efficient means of identifying non-compliant data and supports rapid decision-making.Equally important is the evaluation of instrument performance through diagnostic readbacks recorded during the analysis. These parameters provide insight into the physical and operational state of the instrument at the time of measurement. For ICP-MS, key readbacks include nebuliser gas pressure, vacuum levels, and interface conditions. Changes in these parameters can indicate issues such as partial blockages, salt deposition, or vacuum degradation. Similarly, plasma-related parameters and gas flow stability are critical indicators in both ICP-OES and ICP-MS systems. By correlating readback trends with analytical results, analysts can identify the root causes of anomalies, distinguish between instrument-related and sample-related issues, and take corrective action where necessary. This diagnostic capability is particularly valuable when troubleshooting unexpected results or when sharing data with technical support teams for further investigation.Once the data has been thoroughly reviewed and validated, the final step is to export and communicate the results in a clear and usable format. Structured reporting tools enable the generation of comprehensive summaries that include concentration data, calibration details, quality control results, and any associated flags or annotations. These reports are essential for documentation, regulatory submissions, and communication with stakeholders. For greater flexibility, exporting data in CSV format allows integration with external tools such as spreadsheet software, statistical analysis platforms, or laboratory information management systems (LIMS). This interoperability facilitates advanced data analysis, long-term data storage, and seamless integration into broader laboratory workflows.<h3>Conclusion</h3>In conclusion, post-acquisition data processing is not merely a procedural step but a critical component of the analytical workflow that determines the reliability and scientific validity of results. Through careful organisation of data, rigorous application of correction models, detailed evaluation of calibration performance, and continuous monitoring of instrument diagnostics, analysts can ensure that their results are both accurate and defensible. As analytical technologies continue to evolve and datasets become increasingly complex, the importance of robust and systematic data evaluation will only grow. Mastery of these workflows transforms raw instrumental signals into high-quality scientific information, underpinning confident decision-making across a wide range of applications.<h3>Acknowledgement</h3>I would like to thank&nbsp;Matthew Gregory&nbsp;Field Applications Scientist, North EMEA, Trace Elemental Analysis and&nbsp;David Fishwick&nbsp;Field Applications Scientist, North EMEA, Trace Elemental Analysis for the support on this blog and the webinars.Sign up for our webinars live and on demand.English<ul><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5795">Lunch and Learn Tips and Tricks Series: Qtegra Part 1</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5976">Lunch and Learn Tips and Tricks Series: Qtegra Part 2</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5977">Lunch and Learn Tips and Tricks Series: Trace Elemental Analysis (ICP-OES &amp; ICP-MS)</a></li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5978">Trace Elemental Analysis: Ask the Expert</a></li></ul>Deutsch<ul><li>19. März 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179134/393E071E3B501943730958BA6203F477">Interne Standards in der ICP-OES: Ein Praxisguide für zuverlässige Qualitätssicherung im Labor</a></li><li>18. Juni 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179292/AE4C576B6A54D1AC182F7F77573D380F">Fehler reduzieren, Durchsatz steigern: Autoverdünnung mit PrepFast am ICP-MS</a></li><li>17. September 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179423/B5019C560431BADCA2A76E54E4EFE56F">ICP-OES smarter nutzen: Probendurchsatz erhöhen, Ressourcen sparen</a></li><li>17. Dezember 2026 <a target="_blank" rel="noopener noreferrer" href="https://event.on24.com/wcc/r/5179530/94EEDD1F56138F5EEE2AF24E29E6C12A">Qtegra ISDS Software Unlocked – Live im Expertengespräch</a></li></ul><blockquote>Visit us on&nbsp;<a target="_blank" rel="noopener noreferrer" href="https://www.linkedin.com/showcase/72003132/admin/dashboard/">LinkedIn:</a>&nbsp;#AnalyticalChemistry #ICPMS #ICPOES #DataAnalysis</blockquote>

From Raw Signals to Reliable Results: Post-Acquisition Data Workflows in ICP Analysis

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 18th May 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you brochure by MILESTONE and application notes by Shimadzu and Thermo Fisher Scientific!<h3>1. MILESTONE: <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?search=ETHOS+LEAN+">ETHOS™ LEAN</a> Compact Microwave Labstation</h3><ul><li>Brochure</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/Brochure_ETHOS_LEAN_1_c80f4403a4.pdf">Full PDF for download</a></li></ul>Sample preparation is the foundation of many analytical workflows, and often the most critical step. In elemental analysis, proper digestion ensures accurate and reproducible results with AAS, ICP, and ICP-MS by enabling complete recovery of target elements, minimizing interferences, and reducing blanks. With over 35 years of innovation and more than 30,000 microwave systems installed worldwide, Milestone is a global leader in microwave sample preparation. The ETHOS LEAN, now in its 2nd series, represents this expertise: a compact, affordable labstation delivering full digestion capabilities without compromise. Beyond digestion, ETHOS LEAN supports solvent extraction for chromatography, solvent-free extraction of natural products, and even microwave synthesis workflows, offering unmatched versatility in its class. Selecting the right system is more than a purchase decision: it’s choosing a partner. With Milestone, you gain not only proven technology but also the knowledge and support to ensure long-term success.<h4>BUILT FOR MORE THAN DIGESTION</h4><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?search=ETHOS+LEAN+">ETHOS LEAN</a> goes beyond digestion. As a compact Microwave Labstation, it supports a suite of accessories that expand its capabilities into multiple workflows. Microwave technology provides a faster, cleaner, and more efficient alternative to conventional sample preparation techniques, reducing processing time, simplifying operations, and minimizing reagent consumption.&nbsp;<h5>Solvent extraction</h5>Closed-vessel microwave technology streamlines extraction for chromatographic analysis, dramatically reducing solvent use and cutting analysis times. Ideal for organic pollutant extraction from environmental samples or fat determination in food and feed.<h5>Solvent-free extraction</h5>Patented Milestone technology enables fast and efficient essential oil extraction in just minutes, preserving aroma and natural composition while minimizing degradation. Selective heating promotes a quicker, more efficient release from plant cells.<h5>Microwave synthesis</h5>Microwave synthesis is a safer and faster alternative to heating mantles or complex reactors, enabling rapid optimization of conditions. Its speed supports research projects and allows practical teaching sessions within standard class times.<h5>High-temperature processes</h5>With the ultraFAST accessory, ETHOS LEAN reaches 1200 °C in just minutes, transforming into a microwave furnace for demanding high-temperature applications such as inorganic synthesis, fusion, or fire assay.<h3>2. Shimadzu: Discriminating between Microsamples of Similar Resins with a Combination of FTIR and Thermal Analysis Instruments</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_01114_en_a9291de45e.pdf">Full PDF for download</a></li></ul><h4>User Benefits</h4><ul><li>Using the ATR method with FTIR spectroscopy enables simple and rapid qualitative analysis of polymers.</li><li>DSC analysis may be able to reveal differences in polymer thermal histories that cannot be confirmed by FTIR alone.</li><li>TG-DTA can be used to confirm the content level of inorganic additives in polymers</li></ul>A wide range of polymer resins is used in modern society for diverse applications, resulting in increasing demand for qualitative analysis of resin microsamples, such as identifying resin contaminants in products or qualitatively evaluating microplastics for environmental impact assessments. FTIR spectrophotometers are commonly used for qualitative analysis of polymers. In particular, the ATR (attenuated total reflectance) method is widely used because measurements can be performed simply and quickly by clamping a sample against a prism to ensure close contact.&nbsp;While the ATR method makes it relatively easy to discriminate between different types of polymers, clear differences may not appear when analyzing similar polymers—for example, when there are only slight differences in the type or content of additives or the thermal histories during manufacturing. In such cases, differences may be confirmed by using thermal analysis instruments, such as a DSC or TG-DTA system.&nbsp;This article describes an example in which three instruments— an <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=IRSpirit-TX">IRSpirit-TX</a> FTIR spectrophotometer, a <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=1&amp;search=DSC-60+Plus">DSC-60 Plus</a> differential scanning calorimeter, and a DTG-60 simultaneous DTA-TG unit (Fig. 1)—were used to confirm differences among six microsamples of polypropylene (PP) resin.<h4>Conclusion</h4>Details of the six types of PP resin identified from the above measurement results are shown in Table 4. The results indicate that by using an FTIR spectrophotometer in combination with thermal analysis equipment, such as DSC and TG-DTA systems, it is possible to distinguish between minute amounts of the same type of resin with various different properties.<h3>3. Thermo Fisher Scientific: XPS depth profiling of advanced solar cells with femtosecond laser ablation</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/xps_depth_profiling_advanced_solar_cells_appnote_7bda4471a5.pdf">Full PDF for download</a></li></ul>Perovskites are an emerging class of materials in the solar cell industry, exhibiting a number of promising properties, such as improved efficiency and weight, compared to traditional silicon-based devices. X-ray photoelectron spectroscopy (XPS) is an established tool in solar cell research due to its ability to provide extremely surface-sensitive information about elemental composition along with chemical and electronic states.¹ XPS is ultimately a surface analysis technique, however, and in order to assess the full composition of complex, multi-layered structures such as solar cells, a technique known as depth profiling is necessary, which performs multiple rounds of successive material removal and analysis.&nbsp;This application note explores a recent study by Chandler et al. that focuses on solar cells designed for aerospace applications,² where accurate determination of the “true” starting composition of the stacks is essential for tests that simulate space conditions, such as radiation exposure. Without a reliable baseline, it becomes impossible to distinguish between changes induced by the experimental conditions and artifacts introduced during analysis. Conventional ion beam sputtering methods used for depth profiling are known to distort chemical information for perovskites; femtosecond laser ablation (fs-LA) is presented as a novel, alternative method that helps to preserve vital chemical information.<h4>Experimental</h4>A halide-perovskite-based solar cell was fabricated on an ITO/SnO₂ substrate using a spin coating method; the structure of the layers is shown in Figure 1.Analysis was performed with the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/2206">Thermo Scientific™ Hypulse™ Surface Analysis System</a>, which is equipped with both traditional ion-beam sputtering and femtosecond-laser ablation capabilities. XPS data was collected in SnapShot acquisition mode using an X-ray spot size of 30-200 µm, depending on the method of depth profiling.&nbsp;A MAGCIS ion gun was employed for the sputter depth profiles, generating either a 500 eV monatomic Ar⁺ beam or 8 keV Ar₁₅₀⁺ clusters. The fs-LA depth profiles were generated using a 1,030 nm wavelength laser operating at a 160 fs pulse length. The pulse energy was increased from 42 µJ to 167 µJ when transitioning from the perovskite layer into the substrate structure. A flood gun was employed for charge neutralization during profiling.<h4>Summary&nbsp;</h4>This study confirms the challenges associated with traditional ion sputtering (both monatomic and cluster) for the depth profiling of perovskite-based solar cells. These methods cause preferential sputtering, particularly of lighter elements like carbon, nitrogen, and iodine, which distorts elemental ratios in the profiles and results in artificial signals, such as the formation of metallic lead (Pb⁰). Depth profiling with femtosecond laser ablation represents a novel and robust alternative that preserves the original chemical composition and oxidation states throughout the perovskite layer. By avoiding preferential removal effects, accurate compositional information is maintained during the profile, and erroneous peak signals associated with chemical reduction are eliminated. These factors are vital in establishing a chemically undisturbed baseline before performing tests that simulate environmental effects on the solar cells.&nbsp;With fs-LA depth profiling, any induced changes can be confidently delineated from analytical artifacts, and researchers can better understand and mitigate environmental effects on solar-cell performance, eventually leading to improved solar technologies for aerospace applications.

News from LabRulezICPMS Library - Week 21, 2026

In February of this year, a GAČR project focused on high-speed scanning probe microscopy was launched. Over the next three years, scientists from CEITEC Brno University of Technology (BUT), in collaboration with the Czech Metrology Institute (CMI), will work to accelerate measurement processes using this technique and to improve the analysis of the acquired data with the help of custom-developed artificial intelligence algorithms. The research results will find applications in both scientific and industrial practice, for example, in monitoring live cells or in chip manufacturing.High-speed atomic force microscopy is a field that allows scientists to study the properties of surfaces of various materials. They use microscopes equipped with a miniature tip and probe only a few nanometers (a millionth of a millimeter) in size, which repeatedly glide along regular paths across the sample surface. The scanned area is on the order of micrometers – smaller than a human red blood cell – and the surface shape is recorded with precision comparable to the distance between individual atoms. The probe scans the surface, enabling scientists to obtain highly detailed images with extremely high resolution. Such measurements usually take only a few minutes, but even that can be too long in some cases,&nbsp;especially for samples that change over time, such as living biological materials, as well as non-living materials whose changes are of interest. Addressing this challenge is the core of the GAČR project, officially titled High-Speed Atomic Force Microscopy with Sparse Sampling.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_a30ca0e27e.jpeg" alt="CEITEC BUT: CEITEC Scientists Aim to Increase &quot;High-Speed Microscopy&quot; Up to Fivefold " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_a30ca0e27e.jpeg 150w," sizes="100vw" width="1600" height="1666">“Our joint work aims to speed up the scanning process by optimizing the path along which the microscope tip moves, so that only truly useful data is measured. At the same time, we want to develop an algorithm capable of evaluating images without the need for an intermediate step of reconstructing data from the omitted parts of the surface,” says principal investigator Petr Klapetek from the Czech Metrology Institute (CMI). He points out that conventional high-speed scanning produces hundreds of images across the entire surface, but for samples that change rapidly over time, the probe may miss the area of interest at a critical moment. Changes occurring within milliseconds may therefore not be captured continuously, and important details can be lost. Researchers worldwide have been seeking ways to speed up scanning, usually by modifying microscopes so that the tip moves faster. However, mechanical acceleration increases error rates, for example, due to excessive vibrations. “Since we are aware of the inherent limits of scanning microscopy, we decided to take a completely different approach and tackle the problem through smarter measurement rather than major hardware modifications,”&nbsp;Petr&nbsp;adds.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_3_86682e0c39.jpeg" alt="CEITEC BUT: CEITEC Scientists Aim to Increase &quot;High-Speed Microscopy&quot; Up to Fivefold " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_3_86682e0c39.jpeg 208w," sizes="100vw" width="1600" height="1200"><h4>Software-based acceleration to overcome design limits</h4>One of the main tasks of the project will therefore be to design new scanning paths. These will remain regular but will be arranged in entirely different patterns to maximize the amount of information obtained in minimal time. Combined with more efficient data processing, this approach could increase scanning speed by up to five times. “Data processing is absolutely crucial for us. We need to develop AI algorithms capable of analyzing and interpreting images directly from such sparsely sampled grids, without needing to know what happened in the unmeasured areas. That will likely be our biggest challenge,” adds co-investigator David Nečas from CEITEC BUT. CEITEC BUT will be responsible for designing the scanning patterns and developing the necessary mathematical methods, while the experimental part – including all measurements and testing – will take place at the CMI.The outcome of this three-year collaboration should be a comprehensive theoretical methodology supported by experimental procedures. It could be used, for example, in biological laboratories studying changes in the behaviour of living samples – typically cells – over time. It may also find applications in semiconductor labs, where high-speed scanning microscopy is used mainly for quality control and defect detection during chip production. The method can measure not only the shape and surface structure of a sample, but also its electrical and other properties. “In practice, it could eventually become part of specialized industrial applications, where high-speed scanning microscopes perform imaging and evaluation almost in real time within inspection lines,” concludes David Nečas.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_2_de02ff2fb2.jpeg" alt="CEITEC BUT: CEITEC Scientists Aim to Increase &quot;High-Speed Microscopy&quot; Up to Fivefold " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_CEITEC_BUT_CEITEC_Scientists_Aim_to_Increase_High_Speed_Microscopy_Up_to_Fivefold_2_de02ff2fb2.jpeg 208w," sizes="100vw" width="1600" height="1200"><blockquote>Brno University of Technology is also currently collaborating with the <a target="_blank" rel="noopener noreferrer" href="https://cmi.gov.cz/?language=en">Czech Metrology Institute</a> and other academic and industrial partners on the European project <a target="_blank" rel="noopener noreferrer" href="https://www.ptb.de/epm2024/dinamo/project">DINAMO</a>, which focuses on developing data-processing methods for calibrating all types of scanning probe microscopes. The team at BUT, led by principal investigator David Nečas, is working on standardizing these methods so that even scientists who are not specialists in this type of microscopy can easily set up the instruments themselves and measure their samples as accurately as possible.</blockquote>

CEITEC Scientists Aim to Increase "High-Speed Microscopy" Up to Fivefold 

Article

Application

Academy

Science and research

Video

Since its establishment in 2011, CEITEC has quickly developed into a cutting-edge infrastructure for research which performs highly alongside the best institutes in Europe. Among the main priorities of CEITEC are the promotion of a motivating and dynamic international scientific environment, the provision of state-of-the-art research infrastructure, and the policy of open communication and equal opportunities.

CEITEC

A unique company dedicated to serving science helping our customers drive productivity and accelerate results. Through our premier brands – Thermo Scientific, Applied Biosystems, Invitrogen, Fisher Scientific and Unity Lab Services.

Thermo Fisher Scientific

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LabRulez

Metrohm

Anton Paar

Agilent Technologies

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Quantum Analytics

SelectScience

C&EN

Is your raw material identification (ID) testing process optimized? Can it handle a high volume of receipts without stretching your QC budget? If you use a sampling booth and/or open papers sacks, plastics buckets/drums, or other commonly used pharmaceutical containers to ID excipients, API, or other raw materials, your ID process can be improved.
This webinar will describe how raw material verification testing is now possible through transparent and non-transparent packaging directly in quarantine using Spatially Offset Raman Spectroscopy (SORS). The Agilent Vaya Raman is the first handheld spectrometer incorporating SORS to quickly identify raw materials directly through containers in a cGMP environment. This webinar will also discuss SORS technology, its impact on the ID test process, and subsequent return on investment (ROI) against current ID testing solutions.
<h5>Key learning objectives</h5>
<ul>
<li>Understand how raw material identity verification through transparent and non-transparent containers removes the need for sampling, increasing testing throughput without increasing costs</li>
<li>Learn how the Vaya system, with true through-barrier SORS technology, works through most common containers – from clear glass vials to multilayer paper sacks</li>
<li>Learn how Vaya improves current testing protocols – from low volume sampling to 100% ID testing</li>
<li>Discover the ROI against classic conventional Raman handhelds and NIR systems</li>
<li>Understand how to streamline an identification process with Vaya</li>
</ul>
<h5>Who should attend?</h5>
<ul>
<li>QC lab managers, analysts, and scientists</li>
<li>Raw material managers</li>
<li>Plant managers</li>
<li>Operation efficiency managers</li>
<li>Continuous improvement managers</li>
<li>Vice Presidents of Quality and Operations</li>
<li>PAT scientists</li>
</ul>
<blockquote>
Presenter: Frederic Prulliere (Raman ID Product Manager, Agilent Technologies)
</blockquote>
<blockquote>
Frederic Prulliere is the Product Manager for the Raman ID product line at Agilent Technologies. Prulliere leads the product development of spatially offset Raman spectroscopy-based solutions, particularly for verifying raw materials at reception. He joined Agilent Technologies in 2012 as a business development manager for mobile Fourier transform infrared spectroscopy (FTIR).
</blockquote>

SelectScience: Rapidly scan your raw materials with SORS

Rapidly scan your raw materials with SORS

We will describe how raw material verification testing is now possible through transparent and non-transparent packaging directly in quarantine using SORS.

We’ll explore polymer characterization, including quick polymer identification for recycling purposes, identifying product defects or failures for quality control, reverse engineering to facilitate product development. We’ll dive into polymer research – an active area of scientific endeavor where performance and a reduced environmental impact are key elements of interest. Learn why vibrational spectroscopy (infrared (IR) and Raman) instruments are useful for the analysis of polymers in an industrial setting, as IR and Raman are highly specific and sensitive tools that are non-destructive and easy to use.
During the session, we’ll offer clear examples that demonstrate the effectiveness of IR and Raman analysis in each of these categories.
<h5>Key webinar take-aways:</h5>
<ul>
<li>The importance of polymer research where performance and a reduced environmental impact are key elements of interest.</li>
<li>Utilizing vibrational spectroscopy (infrared (IR) and Raman) as a useful tool for the analysis of polymers in an industrial setting.</li>
<li>IR and Raman are highly specific and sensitive tools that are non-destructive and easy to use.</li>
<li>Examples will be presented demonstrating the effectiveness of IR and Raman analysis in each of these categories.</li>
</ul>
<blockquote>
Presenter: Dr. Tom Tague (Applications Manager, Bruker Corporation)
</blockquote>
<blockquote>
Dr. Tom Tague is the Applications Manager for Bruker Optics. He is also a member of the Visiting Advisory Committee of the Metropolitan Museum of Art in New York and the Strategic Advisory Board of Amplified Sciences. Dr. Tague received his Ph.D. from the University of Utah in Physical Chemistry and his B.S. also in Chemistry from the University of Texas at San Antonio. He also conducted his postdoctoral research at the University of Virginia working with Professor Lester Andrews. He is a member of the American Chemical Society, Society for Applied Spectroscopy, American Physical Society, and the Optical Society of America. Dr. Tague is active in developing new methods and instrumentation with the goal of improving the sensitivity and detection limits of spectroscopy related applications. Tom has more than 90 publications and 5 Patents.
</blockquote>

Pixabay/Adrian Malec: Polymer Science A to Z: Getting Answers from FTIR and Raman Analyses

Polymer Science A to Z: Getting Answers from FTIR and Raman Analyses

Let’s tackle the science of polymer analysis using the power of spectroscopy, including identification, quality control and reverse engineering. 

Polymer Science A to Z: FTIR and Raman Analyses

Transmission Raman spectroscopy (TRS) is a variant of Raman spectroscopy which is advantageous in probing bulk content of diffusely scattering samples. Spatially offset Raman spectroscopy (SORS) is a variant of Raman spectroscopy that allows highly accurate chemical analysis of objects beneath obscuring surfaces. TRS is used in Agilent TRS100 Raman system for fast assay of tablets, capsules, and other dosage forms. SORS is used in Agilent RapID and Vaya systems for see-through barrier verification applications.
This online seminar provides a comprehensive introduction to the TRS and SORS technologies and their applications.
<blockquote>
Presenter: Yanqia Wang, PhD (Application Engineer, Molecular Spectroscopy, Agilent Technologies, Inc.)
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<blockquote>
Dr. Yanqia Wang started working for Agilent Technologies Inc. as a FTIR application Engineer in 2013, providing pre-&amp;post-sale application support. The products he covers from Bench-top FTIR microscopes to various Mobile FTIR spectrometers. Dr. Wang received his PhD of analytical chemistry from Duke University in 2004, doing dynamic IR spectroscopy research. Then he joined Fitzpatrick Center for Photonics at Duke University, doing Tissue Raman spectrometer instrumentation. Since 2007, Dr. Wang worked for Avery Dennison Corp. as a spectroscopist, providing molecular analytical support to the research &amp; development.
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Agilent Technology: Fast assay of Tablets, Capsules, and other Dosage forms using Transmission Raman Spectroscopy and SORS Raman Spectroscopy

Fast assay of Tablets, Capsules, and other Dosage forms using Transmission Raman Spectroscopy and SORS Raman Spectroscopy

This online seminar provides a comprehensive introduction to the TRS and SORS technologies and their applications.

Tablets, Capsules by Raman Spectroscopy and SORS

IR and Raman spectroscopy are well established, mature techniques present nowadays in most analytical laboratories.  However, they do pose several key fundamental limitations. The new breakthrough technique of Sub-micron Optical Photothermal Infrared (O-PTIR) Spectroscopy overcomes the limited spatial resolution of traditional IR microscopy with submicron resolution and the limited sensitivity and fluorescence interference limitations of Raman microscopy. 
Furthermore, O-PTIR is able to bring together the complementarity of IR and Raman into a single platform, single measurement for the first time, enables sub-micron, simultaneous IR+Raman microscopy delivering IR and Raman spectra from the same spot, at the same time with the same spatial resolution. 
This webinar discusses this novel technique and provides numerous application examples.
<h4>Part 1: Introduction &amp; Overview by Dr. Mustafa Kansiz</h4>
<ul>
<li>Overview of current direct IR (FTIR &amp; QCL) and Raman micro spectroscopic techniques and Fluorescence Microscopy </li>
<li>Introduction to Submicron O-PTIR and simultaneous Raman microscopy (IR+Raman) and the benefits of co-located Fluorescence </li>
<li>Various application examples of particulates, materials science and more</li>
</ul>
<h4>Part 2: Review of Environmental Applications by Dr. Andrew Ault Microplastics, environmental</h4>
Dr. Ault will present the results of his group&#39;s recent publication on an important source of atmospheric particles - Sea Spray Aerosols (SSA).  
In this work, they characterize individual SSA particles using new generation submicron simultaneous IR+Raman (O-PTIR) microscopy for organic profiling, combined with EDX for elemental profiling. 
Dr. Ault will also talk to his recent research relating to microplastics.  
<h5>Key Learning Objectives:</h5>
<ul>
<li>Understand the principle of operation of O-PTIR for submicron IR spectroscopy</li>
<li>Learn about specific applications of submicron simultaneous IR and Raman</li>
<li>How O-PTIR can advance your research goals and increase the impact of your publications</li>
</ul>
<h5>Who Should Attend:</h5>
<ul>
<li>Laboratory Directors and Managers  </li>
<li>Research Professors and Academics</li>
<li>Regional Water Board Researchers</li>
<li>Industrial Failure Analysis Engineers</li>
<li>Chemical and Polymer Engineers and Scientists</li>
<li>Vibrational Spectroscopists</li>
</ul>
<blockquote>
Presenter: Dr. Mustafa Kansiz (Director of Product Management and Marketing, Photothermal Spectroscopy Corp.)
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Presenter: Dr. Andrew Ault (Dow Corning Assistant Professor of Chemistry and Associate Professor of Chemistry, University of Michigan)
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<blockquote>
Presenter: Melissa O&#39;Meara (Forensic Science Consultant, C&amp;EN Media Group)
</blockquote>

C&EN: Sub-500nm Simultaneous IR+Raman Microscopy for Microplastics and Materials Science Research

Sub-500nm Simultaneous IR+Raman Microscopy for Microplastics and Materials Science Research

This webinar discusses this novel technique and provides numerous application examples.

Sub-500nm Simultaneous IR+Raman Microscopy for Microplastics

Raman spectroscopy is used around the globe for identification of unknowns, verification of raw materials, basic R&amp;D, and process monitoring and control. The most commonly deployed technology is based on 785 nm lasers and detectors that leverage innovations from the telecommunications boom in the 1990s. However, this technology has been fundamentally limited by fluorescence interference that overpowers the Raman signal. The most common ways to overcome fluorescence have all had significant drawbacks around cost, safety and sample preparation – until now.
Developed for first responders to help identify unknowns in street narcotics, eXTRaction (XTR) technology uses advanced digital signal processing to separate Raman data from a background. With XTR, 785 nm Raman can be extended to difficult-to-analyze systems.
In this webinar, Dr. Adam J. Hopkins and Elena Hagemann will explain how XTR works and show different use cases for both qualitative and quantitative measurements, including biodiesel and polyurethane production.
<h5>Who should attend?</h5>
<ul>
<li>QA departments looking to extend raw material identification outside the lab</li>
<li>Researchers looking for flexible Raman measurement solutions for a variety of materials</li>
<li>Anyone measuring complex media that is too fluorescent for 785 nm Raman spectroscopy</li>
<li>Process development engineers and scientists looking for upstream/development solutions that can scale with production</li>
</ul>
<h5>Key learning points</h5>
<ul>
<li>XTR processing enables Raman measurements of fluorescent materials</li>
<li>Quantitative measurement performance is not adversely impacted by XTR processing</li>
<li>Raw material ID performance is enhanced with XTR, with identification performance comparable to 1064 nm systems</li>
<li>Non-contact Raman measurements are possible from up to 1.5 meters with XTR enabled systems</li>
</ul>
<blockquote>
Presenter: Adam J. Hopkins, PhD (Spectroscopy Product Manager, Metrohm USA)
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<blockquote>
Dr. Adam J. Hopkins is the Spectroscopy Product Manager at Metrohm USA. He has nearly 20 years of experience as a vibrational spectroscopist. He received his Ph.D. in chemistry from the University of Oregon where he studied nonlinear optical spectroscopy under Geraldine Richmond.
</blockquote>
<blockquote>
Prior to joining Metrohm USA, Adam worked developing spectroscopic solutions for standoff and noncontact sensing applications using Laser Induced Breakdown and Raman spectroscopy. Dr. Hopkins is a member of the American Chemical Society, Society for Applied Spectroscopy, Coblentz Society and SPIE. He is the author of 19 papers and proceedings and is the author of three patents.
</blockquote>
<blockquote>
Presenter: Elena Hagemann (Applications Specialist, Metrohm USA)
</blockquote>
<blockquote>
Elena Hagemann is an Applications Specialist at Metrohm USA in Riverview, Florida. She earned her Master degree in Analytical and Bioanalytical Chemistry at the Applied University of Aalen, Germany, where she completed her studies with her Master thesis focused on Karl Fischer Titration, NIR Spectroscopy and Multivariate Data Analysis. Elena joined the Metrohm Group in August 2013 and started with Metrohm USA in January of 2018, focusing on Raman and NIR Spectroscopy. She performs internal as well as customer training.
</blockquote>

Metrohm: Fluorescence-Free Raman at 785nm

Fluorescence-Free Raman at 785nm

We will explain how XTR works and show different use cases for both qualitative and quantitative measurements, including biodiesel and polyurethane production.

You might be facing challenges with respect to material identification process and its qualification.
Now, with Agilent&#39;s trusted solution - Vaya Raman Spectometer, confidently identify pharmaceutical materials and meet the performance specifications of global pharmacopoeia.
<blockquote>
Presenter: Rob WIlls (Molecular Spectroscopy Specialist, Agilent Technologies)
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Agilent Technologies: Raw Material ID and Raman

Raw Material ID and Raman

Challenges with respect to material identification process and its qualification.

Raw materials identification (RMID) is a crucial regulatory step required before drug manufacturing. Raman spectroscopy is well-suited to making the process simpler, yet some spectrometers are challenged by light-blocking containers or struggle to reach compliance standards.
How do you ensure that your RMID is fast and cost-effective while also meeting data integrity and compliance standards?
Find out in this webinar! 
<h5>Attend this webinar to:</h5>
<ul>
<li>Discover spatially offset Raman spectroscopy (SORS) – a new solution for RMID testing</li>
<li>Learn how SORS deals with common raw materials challenges, including discrimination and hard to scan materials</li>
<li>Explore how Raman spectroscopy can support your green initiative by reducing the need for consumables</li>
</ul>
<blockquote>
Presenter: Frederic Prulliere (Raman ID Product Manager, Agilent Technologies)
</blockquote>

Technology Networks: Discover How Raw Materials Identification Testing Should Be

Discover How Raw Materials Identification Testing Should Be

How do you ensure that your RMID is fast and cost-effective while also meeting data integrity and compliance standards?

The fundamentals of fluorescence analysis will be discussed. Topics considered will be choosing the best excitation wavelength, identifying interferences like the Raman band and second order peaks from the monochromator. Concentration quenching, environmental factors, and a variety of other factors will be discussed.<blockquote>Presenter:&nbsp; Dean Brown (Application Scientist, Molecular Spectroscopy, Agilent Technologies, Inc.)A graduate of the University of Maryland and West Virginia University. Started as research scientist at Johns Hopkins School of Medicine developing clinical laboratory assays. Transitions to an Applications Scientist for Uv/Vis/Nir, Fluorescence, IR and Raman spectroscopy. He has published numerous papers in the field of molecular spectroscopy and served on a number of Committees.</blockquote>

Agilent Technologies: Agilent Webinars On Demand

Back to Basics with Fluorescence: A Tips & Tricks Workshop

The fundamentals of fluorescence analysis will be discussed - choosing the best excitation wavelength, identifying interferences and a variety of other factors.

<div><div container-id="cq-colctrl-lt0" comp-id="A1"><div>This session will delve into model training, method validation, tips and tricks to improve or ensure method robustness and custom methods.Don't miss this opportunity to enhance your understanding and skills!<blockquote>First session: <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/webinar/5748">Watch on-demand here</a></blockquote><h5>In this webinar, you'll learn:</h5><ul><li>How to build method training&nbsp;</li><li>Method validation</li><li>How to ensure model robustness on the Vaya?</li><li>What is a custom method on Vaya?</li></ul>This webinar is beneficial for all Vaya users or any pharma/biopharma customers interested to know more on through-packaging raw materials identification.<blockquote>Presenter: Chris Welsby (Raman ID Product Line Manager, Agilent Technologies)Chris is a PhD chemist, graduating from Cardiff University in 2001 having studied heterogenous catalysis, now focusing on molecular spectroscopy products intended for the pharma industry, namely Spatially Offset Raman Spectroscopy (SORS) through barrier technology, to enable verification of raw material ID through packaging in the warehouse environment. Chris has worked as part of the marketing team on Spatially Offset Raman applications since 2016, firstly as an Applications Scientist and latterly as a Marketing Product Manager of the Vaya handheld for raw material ID.</blockquote></div></div></div>

Agilent Technologies: Tip and Tricks – How to Best Use the Handheld Raman Vaya

Tip and Tricks – How to Best Use the Handheld Raman Vaya

Join us for the second session on Vaya Method Development Tips and Tricks!

How to Best Use Handheld Raman Vaya

Crystallinity strongly affects the mechanical, thermal, and barrier properties of polymer films, yet monitoring it during extrusion is difficult. This work presents an integrated workflow using thermal analysis, Raman spectroscopy, lab‑scale film extrusion, and optical film‑quality inspection to predict and confirm crystallinity and overall product quality in LDPE/PEEK. Thermal analysis provides precise enthalpy of fusion values and baseline crystallinity (typically 35–45%), establishing robust reference data. These values inform calibration of Raman regression models built from C‑H and skeletal vibration bands, enabling rapid, non‑destructive crystallinity forecasting.Using Anton Paar Brabender extrusion equipment, the Raman model is validated in real time during LDPE/PEEK film production, capturing crystallinity changes such as shear‑induced reductions after extrusion. Complementing this, the Film Quality Analyzer identifies defects including black specks, gels, fisheyes, and holes (ASTM D7310). Together, these tools help polymer scientists enhance film uniformity, prevent defects, and accelerate process optimization.<h4>Key Learning Objectives:</h4>1. Understand how crystallinity governs polymer film performance<ul><li>Viewers will learn why crystallinity is critical for mechanical, thermal, and barrier properties of LDPE/PEEK films and why real‑time monitoring during extrusion is challenging but essential for product quality.</li></ul>2. Learn how to quantify crystallinity using thermal and spectroscopic tools<ul><li>They will see how thermal analysis establishes accurate baseline crystallinity values and how Raman spectroscopy—calibrated with those values—can rapidly and non‑destructively predict crystallinity in real time.</li></ul>3. Discover how to validate crystallinity models during extrusion<ul><li>The audience will understand how lab‑scale single‑screw extrusion combined with in‑line Raman analysis tracks crystallinity changes under real processing conditions, including shear‑induced disorder.</li></ul>4. Recognize how optical film‑quality analysis ensures defect‑free products<ul><li>They will learn how an optical Film Quality Analyzer detects defects such as black specks, gels, fisheyes, and holes, enabling consistent, standards‑based quality control (ASTM D7310).</li></ul><blockquote>Speaker: Christoph PielenAfter earning his degree from RWTH Aachen University in Germany, Christoph Pielen joined Brabender GmbH in 2012 as an Application Specialist. He later becoming Laboratory Manager and then President of Brabender CWB in the U.S., where he supported ASTM standard development and customer applications. Following Brabender's 2023 acquisition by Anton Paar, Christoph now serves as Lead Scientist for Texture and Extrusion at Anton Paar USA.Outside work, Christoph enjoys traveling, skiing, and spending time with his two children, Alexander and Victoria, while pursuing his passion for aviation and space exploration.</blockquote>

Anton Paar: From Analysis to Assurance: How Thermal, Raman, and Film Extrusion Techniques Validate Crystallinity and Ensure Polymer Product Quality