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Elemental Evaluation of MXene Degradation and Application in Ion Separation

Tu, 18.8.2026 21:30 CEST
Learn how Agilent 5900 ICP-OES evaluates MXene degradation and tracks metal leaching for advanced ion separation.
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Agilent Technologies: Elemental Evaluation of MXene Degradation and Application in Ion Separation
Agilent Technologies: Elemental Evaluation of MXene Degradation and Application in Ion Separation

Understanding the chemical stability of MXenes under realistic operating conditions is essential for their reliable use in ion separation and electrochemical systems. 

In this webinar, we highlight the application of inductively coupled plasma optical emission spectroscopy (ICP-OES, Agilent-5900) as a powerful analytical tool to quantitatively evaluate elemental evolution during MXene degradation. 

By tracking dissolved species in the solution, ICP-OES enables precise assessment of metal leaching and oxidation under pH and temperature control. Furthermore, we investigate the ion selectivity of Ti₃C₂Tₓ MXene channels and their underlying physicochemical origins. We demonstrate that the interlayer spacing and surface chemistry critically regulate ion mobility, leading to pronounced Li+ selectivity among monovalent and multivalent ions. In these studies, ICP-OES 5900 serves as an indispensable analytical platform, helping us establish a fundamental basis for the application of MXenes in ion separation technologies.

Presenter: Yuan Zhang (Research Assistant Professor, Drexel Nanomaterials Institute, Drexel University)

Dr. Yuan Zhang is a Research Assistant Professor at the Drexel Nanomaterials Institute, Drexel University. An Alexander von Humboldt Fellow and a Cotswold Postdoctoral Fellow, she earned her Ph.D. in Leibniz Institute for New Materials in Germany. Her expertise spans materials science and electrochemistry, focusing on molecular-scale ion transport, 2D MXene nanofluid, and energy storage.

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