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High-Energy XRD - Diffraction Without Limits

Th, 2.7.2026 10:00 CEST
Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions.
Go to the webinar
Bruker: High-Energy XRD - Diffraction Without Limits
Bruker: High-Energy XRD - Diffraction Without Limits

High-energy X-Ray Diffraction (XRD) opens new horizons for materials research beyond the limits of conventional Cu-based systems. The shorter wavelength enables deeper penetration and expanded reciprocal-space coverage, combining with breakthrough software to allow access to structural information that remains hidden with standard approaches.

Join us to explore how high-energy XRD with the D8 ADVANCE HE and D8 DISCOVER HE enables the study of materials under realistic conditions – from simple powders to complete devices such as battery cells.

Discover how advanced high-energy diffraction solutions combine flexible measurement setups with state-of-the-art detector technology to tackle demanding research challenges.

During this session, you will learn how to:

  • Access structural information beyond conventional XRD.
  • Perform total scattering / PDF experiments.
  • Study materials under realistic conditions with advanced sample environments.
  • Apply modern software tools for efficient and robust data analysis.

This webinar will include:

  • Real-world application examples from materials science and energy research.
  • Live instrument demonstrations.
  • Practical guidance to optimize your high-energy XRD experiments.
  • Live Q&A with experts.

Who should attend?

  • Researchers in materials science, chemistry, and functional materials.
  • Battery and energy materials researchers.
  • Scientists working with (or interested in) total scattering and PDF.
  • Anyone exploring next-generation XRD techniques.

Register now to secure your spot and discover how to extend the capabilities of your XRD experiments.

Speaker: Dr. Michael Evans (Product Manager XRD, Bruker AXS)

Bruker
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