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Optimized Elemental Analysis with Tabletop Electron Microscopes

Th, 22.1.2026 17:00 CET
Learn how the upgraded Hitachi TM4000PlusⅢ SEM and Bruker QUANTAX EDS enable fast, high-quality elemental analysis and mapping in minutes—bringing advanced EDS performance to a compact, user-friendly system.
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Bruker: Optimized Elemental Analysis with Tabletop Electron Microscopes
Bruker: Optimized Elemental Analysis with Tabletop Electron Microscopes

Recently, Hitachi’s TM4000PlusⅢ microscopes and Bruker’s QUANTAX EDS system have undergone significant improvements to allow high-throughput elemental analyses (QUANTAX 75-60). In this webinar, in collaboration with Hitachi, we will demonstrate that EDS analyses once limited to high-end systems are now reproducible with a compact and user-friendly SEM.

With the introduction of the new TM4000PlusⅢ tabletop electron microscopes higher probe currents have become available which allows for even higher EDS productivity.

Bruker’s QUANTAX EDS solution now maximizes analytical throughput with high beam currents. The latest ESPRIT Compact software includes the LiveMap function to identify regions of interest in real time and improve workflow efficiency.

To the end user, these new changes translate to enhanced intuitiveness and substantially improved acquisition speed and data quality, allowing challenging samples to be analyzed in a few minutes (e.g., beam-sensitive, with high topography or containing lots of chemical elements).

During the webinar the new features of the TM4000PlusⅢSEMs will be presented, higher probe current, filament indicator, probe current monitor as well as new no-code/low-code automation tools. Powerful tools that can make the compact SEM do complex automated tasks similar to a large full-scale system.  

Achieve high-quality elemental mapping of diverse materials in less than 5 minutes (like battery, powders, alloys, mineralogy).

Effortlessly identify and quantify small particles and heterogeneities in complex or embedded samples.

Who should attend?

  • Microscopists and laboratory managers interested in facilitating and expanding routine analytical capabilities.
  • Academic and industry researchers in materials science, metallurgy, geology, and battery research seeking efficient microanalytical workflows.

Presenter: Jürgen Simon (Sales Manager, Hitachi High-Tech Europe)

Presenter: Julien Aubourg (Application Scientist EDS, Bruker Electron Microscope Analyzers)

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