Interference Correction using the Agilent 5X00 ICP Systems – FACT Modeling and Comparison with Inter-Element Correction IEC

ICP-OES can suffer from spectral interferences.  This presentation will discuss the different types of interferences present in ICP and how to correct for them.  IEC is the classical way of correcting for interferences and will be discussed briefly.  However, modeling techniques, like FACT can be easier and more effective in many cases.  We will go through what FACT is and how to set this techniques on an ICP system.

Presenter: Paul Krampitz (Application Scientist, Agilent Technologies, Inc.)

Paul is a graduate of Bowling Green State University with a Chemistry Bachelor of Science degree. Twenty – five years of Spectroscopy experience mainly Inductively Coupled Plasma (ICP) Spectroscopy as well as ICP-MS and AAS. His experience also includes X-Ray Fluorescence (ED, WD), Laser Ablation, Inorganic Speciation and Microwave Plasma Spectroscopy. Market Segment expertise includes environmental, petrochemical, metallurgical applications.

Presenter: Luke Gormley (Pre-Sales Application Engineer, Agilent Technologies, Inc.)

Luke earned his Bachelor of Science in Chemistry from Clemson University in South Carolina. He began his career at an environmental contract testing laboratory, where he used EPA methods for routine ICP-OES analysis. Later, he expanded his role by joining the laboratory’s instrument service and repair team, troubleshooting a wide range of analytical instruments and testing equipment. In 2025 Luke joined Agilent Technologies, where he now works as an Application Scientist, supporting the ICP-OES, MP-AES, and AA product lines.