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Making Sense of Microplastics Data Using YABE, a Reporting Tool for the Agilent 8700 LDIR

RECORD | Already taken place Th, 11.9.2025
Learn how YABE simplifies microplastics data from the Agilent 8700 LDIR. Discover its role in harmonizing analysis, improving reporting, and advancing global plastics research.
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C&EN: Making Sense of Microplastics Data Using YABE, a Reporting Tool for the Agilent 8700 LDIR
C&EN: Making Sense of Microplastics Data Using YABE, a Reporting Tool for the Agilent 8700 LDIR

Particle-focused microplastics analysis produces large volumes of data that can be difficult to process. YABE is a user-friendly (Python-based) application that summarizes data extracted after microplastics sample analysis on the Agilent 8700 Laser Direct Infrared (LDIR). Using the LDIR-generated Excel reports, YABE can provide summarized results, categorized by polymer type, particle size, and HQI (match quality), while also using the LDIR-generated measurement parameters to also describe the particle shape and an estimation of mass.

YABE was developed in the framework of the IAEA’s NUTEC Plastics Initiative to address the global challenge of plastic pollution 

Key Learning Objectives:
  • Describe the functionality of the YABE application, from its logical design, based on the latest advances in microplastic analysis found in the literature.
  • Demonstrate its practical implementation by microplastics researchers and anyone doing microplastics analysis.
  • Show how such reporting tools can assist in the harmonization of analysis and make results from studies more comparable.
Who Should Attend:
  • Microplastics researchers
  • Microplastics analysts from commercial, QA, or research labs seeking to understand key challenges in Microplastics analysis
  • Those interested in microplastics analysis and the development of standardized methodology around the world. 

Presenter: Yasser Morera Gómez (Environmental Scientist and Researcher,
BIOMA Institute for Biodiversity and the Environment, University of Navarra, Spain)

Presenter: Nathalie Bernard (IAEA, Monaco, PhD Candidate, University of Buenos Aires, Argentina)

Presenter: Darren Robey (Product Manager: IR Imaging, Agilent Technologies)

Presenter: Melissa O'Meara (Forensic Science Consultant, C&EN Media Group)

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