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Four Things You Shouldn't Be Experiencing When Doing Heavy Metals Analysis of Cannabis and Cannabis Products

RECORD | Already taken place Sa, 31.12.2022
In this webinar, our ICP-MS expert will show how an Agilent ICP-MS Cannabis Analyzer overcomes problems that are common with other instruments.
Go to the webinar
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Agilent Technologies: Agilent Webinars On Demand

Testing cannabis for "the big four” heavy metals: arsenic, cadmium, mercury, and lead is now a regulatory requirement in many jurisdictions. Many manufacturers also test for nutritional elements such as calcium and magnesium. Measuring metals in cannabis plant materials and manufactured products can be technically challenging due to the myriad of other components in each sample. However, there are four things that shouldn’t be slowing down analyses, because they are easily avoided:

  1. Having to prepare samples multiple times to measure both low- and high-concentration elements
  2. Getting inaccurate results due to unexpected interferences
  3. Calibration or QC failures forcing sample remeasurement
  4. Poor vendor response to support requests, creating lots of instrument downtime.

In this webinar, our ICP-MS expert will show how an Agilent ICP-MS Cannabis Analyzer overcomes these problems that are common with other instruments.

Key Learning Objectives/What attendees will learn:

  1. Common problems experienced when doing metals analysis of cannabis and cannabis-based products
  2. How to overcome or avoid those problems
  3. How to assess which ICP-MS instrument to purchase

Who Should Attend:

  • Future or current cannabis lab managers
  • Future or current cannabis lab investors
  • Future or current cannabis testing lab analysts and chemists
  • Entrepreneurs considering starting a cannabis testing lab or branch

For any technical questions please contact Jordan Ramesh: [email protected]

Presenter: Jenny Nelson, PhD (Application Scientist, Agilent Technologies, Inc.)

Dr. Jenny Nelson is an Applications Scientist with Agilent Technologies specializing in Inductively Coupled Plasma Mass Spectroscopy (ICP-MS), Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES), Microwave Plasma Atomic Emission Spectroscopy (MP-AES). Her broad knowledge of atomic spectroscopy has been applied to both AOAC and ASTM through her serving on expert review panels, chairing committees, and volunteering to develop new methods needed by the industry.

Presenter: L. Craig Jones (ICP-MS Application Scientist, Agilent Technologies, Inc.)

Craig has been with Agilent for over 15 years as an ICP-MS applications scientist. He has been involved with multiple type of applications for ICP-MS, including environmental, pharmaceutical, semiconductor, geologic, and clinical analyses, to name a few. Previous to Agilent he worked in an environmental lab performing analysis and supervising both the inorganic and organic sections of the laboratory. In his spare time, Craig enjoys volunteering at the local marine science center, mountain biking, hiking, and relaxing at the beach. Craig obtained a Bachelor of Science degree in chemistry from Fort Lewis College in Durango, CO.

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