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Effortless UV-VIS Analysis with Long Pathlength Measurements

RECORD | Already taken place Th, 15.1.2026
The Cary 3500's flexible sampling options make this concentration analysis more effortless than ever before.
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Agilent Technologies: Effortless UV-VIS Analysis with Long Pathlength Measurements
Agilent Technologies: Effortless UV-VIS Analysis with Long Pathlength Measurements

Long pathlength cuvettes are critical options for improving UV-VIS sensitivity. With pathlengths greater than traditional 1 cm, you can improve concentration analysis detection limits.

The Cary 3500's flexible sampling options make this concentration analysis more effortless than ever before.

Presenter: Scott Melis, PhD (Application Scientist, Agilent Technologies, Inc.)

Scott Melis has a PHD in Physics from Georgetown University in Washington, DC and started with Agilent in 2021 as a Molecular Spectroscopy Application Scientist. In his graduate work, Scott studied nanoparticle formation and growth for a variety of applications. Projects that he worked with include developing processes to deposit and characterize semiconducting molecular nano-cocrystals for use in optoelectronic devices as well as controlling polymer nanoparticle size through rapid mixing conditions.

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