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Wiley Analytical Science is a subject-focused website hosting professional and peer-reviewed content from five well-established publication-based websites in Analytical Science.
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From Lab to Market: Accelerating Next Generation Battery Development with Plasma FIB-SEM and TOF-SIMS Workflows

RECORD | Already taken place Tu, 14.11.2023
The role of a Scanning Electron Microscope equipped with a Focused Ion Beam (FIB-SEM) uniquely combined with a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS).
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WAS: From Lab to Market: Accelerating Next Generation Battery Development with Plasma FIB-SEM and TOF-SIMS Workflows

WAS: From Lab to Market: Accelerating Next Generation Battery Development with Plasma FIB-SEM and TOF-SIMS Workflows

Electrochemical materials in battery designs and research on them are critical in achieving a sustainable energy future as well as energy independence from fossil fuels.

In practice, energy density, cell longevity, and charge rate are bonded to chemical composition and specific structural features within the batteries. In general, optimization of all these parameters is a multiscale, multimodal challenge that consists of the analysis of the anode, cathode, electrolyte, and their interphases.

This talk introduces the role of a Scanning Electron Microscope equipped with a Focused Ion Beam (FIB-SEM) uniquely combined with a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) in the characterization of the morphology and chemical composition of Li-ion batteries interphases. We will specifically focus on how SEM observation with ToF-SIMS and other analytical techniques such as Energy Dispersive X-ray spectroscopy (EDS) can be used to better understand and evaluate characteristics such as degradation of battery material, SEI formation, or chemical phase change within the battery cell.

Key Learnings

  • Explore the critical role of Li-Ion Batteries in achieving sustainable energy and independence from fossil fuels.

  • Gain insights into optimizing cell longevity, and charge rate through chemical composition and structural analysis using Plasma Focused Ion Beam Scanning Electron Microscope (Plasma FIB-SEM) with an integrated Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS).

  • Learn about advanced tools like FIB-SEM and ToF-SIMS for characterizing Li-ion battery components and interphases.

Presenter: Dr. Petr Klímek (Product Marketing Director, TESCAN Group)

Presenter: Dr. Zachary Karmiol (Research and Development Scientist, Dragonfly Energy)

Presenter: Dr. Martin Friedrich (Editor, Wiley Analytical Science, Moderator)

Wiley Analytical Science
 

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