Avoiding Double Charged Interferences on Single Quadrupole ICP-MS

The Need for Half-Mass Measurement is real when running a single quad ICP-MS and with doubly charged interferences.

ORS is very capable at the removal of polyatomic interferences under Helium Collision Mode; however, some samples contain high and variable levels of Rare Earth Elements (REE’s). REE’s that have relatively low second ionization potentials meaning they can form ions with a 2+ charge. Even at only 1% formation, if concentrations are high, the interferences can be significant enough. Let me show you how to set the half-mass measurement up in your software.

Presenter: Jenny Nelson, PhD (Application Scientist, Agilent Technologies, Inc).

Dr. Jenny Nelson is an Applications Scientist with Agilent Technologies specializing in Inductively Coupled Plasma Mass Spectroscopy (ICP-MS), Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES), Microwave Plasma Atomic Emission Spectroscopy (MP-AES). Her broad knowledge of atomic spectroscopy has been applied to both AOAC and ASTM through her serving on expert review panels, chairing committees, and volunteering to develop new methods needed by the industry.

Presenter: L. Craig Jones (ICP-MS Application Scientist, Agilent Technologies, Inc.)

Craig has been with Agilent for over 15 years as an ICP-MS applications scientist. He has been involved with multiple type of applications for ICP-MS, including environmental, pharmaceutical, semiconductor, geologic, and clinical analyses, to name a few. Previous to Agilent he worked in an environmental lab performing analysis and supervising both the inorganic and organic sections of the laboratory. In his spare time, Craig enjoys volunteering at the local marine science center, mountain biking, hiking, and relaxing at the beach. Craig obtained a Bachelor of Science degree in chemistry from Fort Lewis College in Durango, CO.