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Simultaneous Data Collection - Improving Your UV-Vis Workflows

RECORD | Already taken place Fr, 21.10.2022
When using a UV-VIS Spectrometer for routine measurements, efficiency and throughput are key.
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Agilent Technologies: Simultaneous Data Collection - Improving Your UV-Vis Workflows
Agilent Technologies: Simultaneous Data Collection - Improving Your UV-Vis Workflows

When using a UV-VIS Spectrometer for routine measurements, efficiency and throughput are key. The traditional measurement workflow can be improved through simultaneous data collection - which allows for faster measurements and the ability to run multiple experiments at the same time.

Presenter: Scott Melis, PhD (Application Scientist, Agilent Technologies, Inc.)

Scott Melis has a PHD in Physics from Georgetown University in Washington, DC and started with Agilent in 2021 as a Molecular Spectroscopy Application Scientist. In his graduate work, Scott studied nanoparticle formation and growth for a variety of applications. Projects that he worked with include developing processes to deposit and characterize semiconducting molecular nano-cocrystals for use in optoelectronic devices as well as controlling polymer nanoparticle size through rapid mixing conditions.

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