Alloys are formed when a metal is combined with another element to strengthen the base metal’s properties. Basically, an alloy is just a modified metal. Superalloys are similar, but these specific high-performance materials are held to a higher standard. They are typically nickel-based, cobalt-based, titanium-based, or iron-based.&nbsp;To be classified as a superalloy, the alloy must be able to reliably function under extremely high temperatures, possess superior strength and surface stability, and must be resistant to thermal creep deformation. Strong corrosion and oxidation resistance are also features of superalloys, but it’s important to note that they are not impervious to oxidation over time if protective measures are not taken. Unfortunately, even when protective measures are taken, contaminants like sulfur threaten to render that protection useless.<h4>Why is Protection from Oxidation Important?</h4>Oxidation negatively affects a superalloy by weakening its strength, which over time can lead to embrittlement and cracking. Since high-performance materials like superalloys are mainly used and relied on in industries like aerospace and nuclear energy, it is crucial that these materials perform as intended. Material failures could be the difference between life and death, in some circumstances.<h4>Selective Oxidation</h4>To make superalloys even more indestructible and shield against oxidation, selective oxidation is performed. With selective oxidation, superalloys are designed to oxidize in a way that creates a protective layer of oxidized material that “covers” the alloy, keeping the alloy’s inner structure from oxygen invasion. However, this means that in order to keep protecting the superalloy’s infrastructure, the protective oxidized layer needs to remain stable and intact.<h4>Sulfur: A Dangerous Threat</h4>The presence of sulfur, even at trace levels, can interfere with the selective oxidation process. Sulfur degrades that protective layer, leaving the superalloy vulnerable to negative oxidation and shortening its useful lifespan. Therefore, the accurate determination of sulfur content, down to the tenth of a microgram, is paramount for ensuring optimal performance and longevity in superalloys.<h4>A Combustion Technique for Ultimate Confidence</h4>Historically, the only way to accurately determine ultra-low levels of sulfur was with<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1842"> glow discharge mass spectrometry (GD-MS)</a>, due to its high sensitivity. Now, even combustion methods can be used when paired with the right instruments, like<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1879"> LECO’s CS844ES.</a>&nbsp;<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/LECO_rada_844_Analyza_uhliku_a_siry_spalovaci_metodou_18532af2ef.jpg" alt="LECO: Superalloys and Sulfur: How Even Trace Amounts Can Be Detrimental: LECO 844 Series Combustion Analysis for Carbon and Sulfur." srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_LECO_rada_844_Analyza_uhliku_a_siry_spalovaci_metodou_18532af2ef.jpg 139w," sizes="100vw" width="710" height="792">The CS844ES uses high-frequency combustion and intelligent carrier gas management with infrared detection to reach a detection limit of approximately 0.1μg, guaranteeing even trace amounts of sulfur will be detected and ensuring confident quality control of superalloys. The sensitivity, ease-of-use, and speed of this instrument make it a reliable tool for any lab. Plus, the cost of combustion instrumentation is significantly lower than GD-MS, making it a practical choice as well.<h4>More About Sulfur and Superalloys</h4>Since superalloys make up fundamental parts of aerospace equipment, medical devices, and more, knowing that they will perform as they are supposed to is paramount. Feeling confident in sulfur level results can be achieved through specialized combustion techniques, avoiding costly GD-MS.&nbsp;To learn more about LECO’s CS844ES, <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/CS_844_844_ES_S_STEEL_NICKEL_SUPERALLOYS_203_821_540_9f6feba049.pdf">download this app note</a> that details how the instrument performed when testing steel, nickel, and superalloys. You can also <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1879">visit our website</a> to read more about the instrument and<a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/209_214_5c92613a24.pdf"> download a brochure.</a> To learn more about how LECO serves the high-performance materials industry, visit our<a target="_blank" rel="noopener noreferrer" href="https://www.leco.com/applications/high-performance-materials/"> High Performance Materials Resource Hub.</a>

Superalloys and Sulfur: How Even Trace Amounts Can Be Detrimental

The standard uncertainty arising from random effects is often derived from repeated experiments and is quantified in terms of the standard deviation s of the measured values of the quantity. If it is the standard uncertainty arising from random effects on a single measurement that is required, then the observed standard deviation s is used without change. However, for a result which is the mean x of n measurements the standard uncertainty decreases as n increases, so that:<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Eurachem_Using_repeated_measurements_to_improve_the_standard_uncertainty_equation_1_19f8f07f8f.jpg" alt="Eurachem: Using repeated measurements to improve the standard uncertainty - Equation 1" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Eurachem_Using_repeated_measurements_to_improve_the_standard_uncertainty_equation_1_19f8f07f8f.jpg 245w," sizes="100vw" width="485" height="138">Example 1 shows how Eq (1) applies when estimating the uncertainty of a mean value, but not when considering the uncertainty of individual observations.<blockquote>Example 1 A volumetric pipette is calibrated with 12 measurements; the mean and the standard deviation are calculated. Eq. 1 applies to estimate the standard uncertainty of the mean value. However, when using the pipette to deliver one aliquot, Eq. 1 does not apply and the standard uncertainty due to random variation on this single measurement is the standard deviation s</blockquote>For Eq (1) to be valid, it is a requirement that all the measurements are independent and from a stable test sample under the same measurement conditions. The measurement conditions for all the measurements could be, for example, 1) repeatability conditions, 2) intermediate precision (within laboratory reproducibility) conditions or 3) reproducibility conditions&nbsp;It is very important to be aware that the standard uncertainty given by Eq. 1 only gives the estimated uncertainty due to random variation under the conditions of measurement under which the observations were taken, and is only strictly valid for independent observations.&nbsp;It can be hard to decide whether observations are sufficiently independent for Eq. 1 to apply, as there is no simple, general, rule. The following paragraphs therefore give examples of different circumstances to help identify circumstances when Eq. 1 can safely be used.<h3>Example where Equation (1) applies&nbsp;</h3><h4>Measurement of inhomogeneous samples&nbsp;</h4>If inhomogeneity for test samples is a major part of the uncertainty the analyst may choose to measure more test portions from each test sample in order to reduce the standard uncertainty. If all these measurements are made under repeatability conditions, i.e. the same measurement conditions following the whole procedure, including repeated random sampling from the test sample, the standard deviation of the mean, given by Eq. (1), should be used to estimate the uncertainty arising from variation under repeatability conditions.&nbsp;<h3>Examples where Equation (1) does not apply&nbsp;</h3>The following paragraphs give two examples where neither the standard deviation nor the standard deviation of the mean can be directly applied without further analysis of the data.&nbsp;<h4>Measurements taken in groups&nbsp;</h4>One example is when we have data from internal quality control from a measurement procedure that includes a calibration before analysis each day. We want to calculate the standard uncertainty of the mean value used to set the central line in the QC chart. The data consist of duplicate QC measurements performed on a stable test sample each day over a longer period of time (say, p days), giving a total of 2p observations; that is, p groups of two measurements. Because each pair of duplicate measurements has a single calibration error in common; the duplicates within the data set are not strictly independent and Eq. (1) cannot be directly used for all 2p observations. The uncertainty of the mean can most easily be calculated by taking the standard deviation of the p means for each day and dividing that standard deviation by √p . Analysis of variance can also be useful in similar cases. Similar principles apply to other kinds of grouping, including grouping by operator, instrument etc.&nbsp;<h4>Measurement when the test item or measurement system is not stable over time</h4>Another common example is time dependent data. The time dependence could be due to instrument drift or to actual change in concentration by time. In such cases the error for a given observation is partly random and in part ‘carried over’ from the previous observation. Again the errors affecting each observation are not independent because some part of the error is common to successive observations; Eq. (1) can not be used and more complex statistical techniques, that allow for correlation, must be used to process the data.&nbsp;For further guidance on the treatment of correlated data in uncertainty evaluation, see Eurolab Technical Report 1/2006: Guide to the Evaluation of Measurement Uncertainty for Quantitative Test Results, Appendix A.5

Using repeated measurements to improve the standard uncertainty

Our Library never stops expanding. What are the most recent contributions to LabRulezICPMS Library in the week of 27th July 2026? Check out new documents from the field of spectroscopy/spectrometry and related techniques!<blockquote>👉 <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library">SEARCH THE LARGEST REPOSITORY OF DOCUMENTS ABOUT SPECTROSCOPY/SPECTROMETRY RELATED TECHNIQUES</a></blockquote><blockquote>👉 Need info about different analytical techniques? Peek into <a target="_blank" rel="noopener noreferrer" href="https://lcms.labrulez.com/library">LabRulezLCMS</a> or <a target="_blank" rel="noopener noreferrer" href="https://gcms.labrulez.com/library">LabRulezGCMS</a> libraries.</blockquote>This week we bring you application notes by Agilent Technologies, Shimadzu and Thermo Fisher Scientific!<h3>1. Agilent Technologies: High-Precision Determination of Phosphorus and Potassium in Fertilizers by ICP-OES</h3>Accurate nutrient analysis of fertilizers using an <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=5800">Agilent 5800 ICP-OES</a> and standard bracketing<ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_fertilizers_standard_bracketing_5800_icp_oes_5994_9311en_agilent_83cbca87fd.pdf">Full PDF for download</a>&nbsp;</li></ul>Accurate characterization of fertilizer nutrient content is critical for optimizing plant growth, maximizing yield, and ensuring sustainable agricultural practices. Fertilizers must comply with strict regulatory specifications, particularly for declared NPK (nitrogen–phosphorus–potassium) ratios, which define the relative nutrient content supplied to crops. Even small deviations from the specified ratio can impact plant yield, regulatory compliance, customer confidence in the product, as well as its commercial value.&nbsp;Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) is a well-established technique for multi-element analysis of complex samples, so is ideally suited to meet the precision and accuracy requirements of fertilizer testing.1,2 However, applications that require very tight tolerances, such as NPK verification, benefit from enhanced calibration approaches as even small deviations from reported values can have large financial implications for the manufacturer.Using Agilent ICP-OES instruments, standard bracketing calibration based on a standard–sample–standard measurement sequence, minimizes the impact of sample-to-sample variability and matrix effects.3,4 This approach further improves analytical precision and accuracy compared to conventional external calibration, making it a particularly valuable method for analyzing fertilizers with tightly controlled specifications.&nbsp;In this study, an Agilent 5800 Vertical Dual View (VDV) ICP-OES, equipped with an Agilent SPS 4 autosampler and controlled using Agilent ICP Expert Pro software,5 was used to determine P and K concentrations and corresponding NPK ratios in a standard reference material (SRM) and two commercially available fertilizers. The standard bracketing method was adapted from ISO methods 11494 and 114956,7 and adjusted for fertilizer analysis. The performance of the method, when combined with real-time data processing tools, was evaluated for accuracy and precision.<h4>Experimental&nbsp;</h4><h5>Instrumentation&nbsp;</h5>The <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=5800">Agilent 5800 VDV ICP-OES </a>was configured with the <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/library?mainauthorItems=10&amp;search=SPS+4+autosampler">Agilent SPS 4 autosampler</a>, which provided automated sample delivery to the instrument (Figure 1). The 5800 ICP-OES was equipped with an Agilent SeaSpray nebulizer, double-pass cyclonic spray chamber, and one-piece VDV torch with a 1.8 mm internal diameter (ID) injector. All components were controlled by Agilent ICP Expert Pro* software. Instrument operating parameters are listed in Table 1.<h4>Conclusion&nbsp;</h4>This study demonstrates the effectiveness of the Agilent 5800 VDV ICP-OES standard bracketing method for high-precision determination of phosphorus and potassium in fertilizers. The method delivered excellent performance, with relative standard deviations below 0.1% and excellent agreement with expected NPK values, with recoveries ranging from 99 to 102%. The combination of gravimetrically prepared standards, internal standard correction, and bracketing calibration minimizes analytical variability and ensures reliable results for fertilizer quality control.&nbsp;In addition, Agilent ICP Expert Pro software streamlines analysis through real-time calculations and automated quality control tools, improving laboratory efficiency and reducing the risk of reporting errors. This approach provides a robust and practical solution for high throughput fertilizer testing laboratories, enabling precise NPK verification that strengthens regulatory compliance, reduces the risk of mislabeling, and supports accurate product pricing.<h3>2. Shimadzu: Multifaceted Evaluation of Frozen Tempura Batter Coating Focusing on Food Texture</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/an_01_00987_en_f919b540e7.pdf">Full PDF for download</a></li></ul>The “deliciousness” of foods consists of multiple factors, including taste, smell, and visual appeal. However, texture, sometimes called “mouthfeel,” is also one extremely important factor. Mouthfeel refers to the physical sensations experienced when food is placed in the mouth or chewed, and is expressed by various onomatopoeic words such as “crisp” and “chewy.” Among these, the packaging of some foods uses onomatopoeic terms to emphasize the appeal of their distinctive textures, and this has become an important “selling point” for consumers when deciding which product to select.&nbsp;In the development of food products, the method of evaluating texture has become a key point. Sensory methods have long been used, but because sensory evaluations depend on the human senses, they are easily influenced by differences between individuals conducting the evaluation and their physical condition.Thus, the difficulty in ensuring repeatability is an issue. As an additional issue, technical training for the panelists who conduct evaluations also requires time and labor. To compensate for these problems, evaluation methods based on measurement of physical properties with instruments may be used. This approach eliminatesthe human error that had been a problem with sensory evaluations, enabling objective evaluations.&nbsp;Food texture is also complexly influenced by the interactions of various factors, such as the ingredients contained in the food, their amounts, and the cooking method. Since differences in these factors may appear in the structure and surface condition of foods, observation and measurement of the internalstructure and surface condition of foods make it possible to analyze and understand the factors that contribute to texture, allowing more efficient food product development from the physical viewpoint. This article introduces an example of an analysis of the differencesin texture that occur due to differences in the heating method from the aspects of evaluation of physical properties and structural and surface observation, using frozen tempura asthe testsample.<h4>Experiment&nbsp;</h4>In this experiment, four instruments were used for evaluation of mechanical properties and structural and surface observation. Table 1 shows the names of the instruments, the purpose of the experiment, and the corresponding sectionsin this article. The test samples used here were commercially-available frozen tempura, which features “moistness” when prepared by microwave oven cooking and “crispness” after microwave oven + oven cooking. The “Moist” type is prepared by heating for 1 min in a microwave oven, and the “Crisp” type is prepared by additional heating in an oven after microwave heating. Since the heating time in the oven is adjusted depending on the sample size required by each instrument, the specific sample preparation procedure and the flow of the tests will be described in the sections concerning each instrument.<h5>Evaluation of Coating Surface Roughness by Laser Microscope&nbsp;</h5>The laser microscope was used in high-magnification measurements of the roughness of the sample surface and color observation (color images). It is possible to grasp the differences in the batter coatings of the “Moist” and “Crisp” types from changes in roughness and also changes in color. Fig. 11 shows the appearance of the OLS5500 laser microscope used here. In this instrument, optical resolution is enhanced by using a singlewavelength 405 nm laser beam, and topographical information can be acquired by reflective confocal laser microscopy. Color images of the same field can also be obtained by using a white LED.In this experiment, the samples were prepared by the following procedure in order to observe the same areas of the “Moist” and “Crisp” samples. First, the entire kabocha tempura was heated for 1 min in the microwave oven, after which part of the sample was cut off and observed on the stage (Fig. 12). Following this, the observed sample was heated in the oven and placed on the stage again, and the “Crisp” sample was observed (Fig. 13). To observe the shape of a wide area of the sample, an alignment (“tile-stitching”) function was used. The image acquisition condition was the ultra-high speed mode using a 20x objective lens.<h4>Conclusion&nbsp;</h4>A sensory evaluation and evaluation of physical properties using a texture analyzer, and structural observations from the macro to the micro level using an X-ray CT, laser microscope, and SEM were conducted for frozen tempura with different food textures depending on the heating conditions. The impression of the food texture, or “mouthfeel,” obtained in the sensory evaluation was quantified in the form of physical property values by using the texture analyzer, and the factors that formed the grounds for those numerical values were then evaluated based on the results of various types of observation. As a result, it was suggested that differences in food texture correspond to changes in the food structure and oil content.&nbsp;In this experiment, different samples were examined with four types of instruments. However, if physical property tests can be carried out with the samples as-is after observation of the same areas, a more direct and high accuracy analysis is considered to be possible. Moreover, in this experiment, the food texture was changed by using different heating methods, but in cases where the ingredients (flour, oil) or the deep-frying method is changed, there is a possibility that different factors from those in this study may contribute to the texture. As demonstrated in this experiment, although “food texture” is often grasped sensorily, as suggested by the term “mouthfeel,” this property can be visualized scientifically in terms of the structure and physical properties of the food and the condition of the oil content by combining multifaceted evaluations using multiple instruments. This technique is expected to become an effective approach for reproducing and controlling the target texture in food product development and quality design.<h3>3. Thermo Fisher Scientific: Bauxite analysis with Niton XRF analyzers</h3><ul><li>Application note</li><li><a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/labrulez-bucket-strapi-h3hsga3/bauxite_analysis_with_niton_xrf_analyzers_an1795_en_93b319a76e.pdf">Full PDF for download</a></li></ul>Globally, bauxite is the primary source of aluminum (Al) ore and anchors a major industry in many countries, including China, Australia, and Brazil. As such, grading Al concentration is of paramount interest in the mine as is the need to determine concentrations of penalty elements. The desired goal is to conduct all the analysis in a way that maximizes productivity.&nbsp;<h4>Application&nbsp;</h4>Analysis of aluminum (Al), silicon (Si), and iron (Fe) presents unique challenges. Accurate analysis of all three is critical for ore grading and understanding their influence on the processing and production of the primary metal of interest. Relying on lab-analysis only in bauxite mining operation often results in costly time delays and reduced productivity while waiting hour if not days and weeks for the results.&nbsp;With the ruggedized, dust- and splash-proof <a target="_blank" rel="noopener noreferrer" href="https://icpms.labrulez.com/products/1997">Thermo Scientific™ Niton™ XL3t GOLDD+ XRL Analyzer</a>, near lab-quality analysis of Al, Si and Fe can be generated on sites, enabling quick decisions in at remote mines. Indeed, the Niton XL3t GOLDD+ analyzer provides rapid and accurate elemental analyses of bauxite ore enabling to map chemical concentrations in realtime, identify excavation hotspots and detect penalty elements.&nbsp;<h4>Handheld XRF analyzer&nbsp;</h4>Thermo Scientific Niton Handheld XRF analyzers, including the Niton XL3 GOLDD+ analyzer, easily analyze elements from magnesium (Mg) to uranium (U) to fill all exploration and mining needs. These instruments make it easy to perform trend analysis by averaging readings in real-time or by downloading results later to a PC. They deliver fast, accurate elemental analysis for intensive metals exploration and production whether base metals, precious metals, or even rare earth elements.<h4>Comments&nbsp;</h4>The correlation coefficients and repeatability data for the key elements in bauxite analysis demonstrate the excellent accuracy and precision of the handheld Niton XL3 950 GOLDD+ analyzer, indicating that the Niton XL3 GOLDD+ instrument is ideal for fast mine or field analysis. The instant chemical information it provides allows the user to make critical decisions with minimal downtime, keeping projects running and productive. Additionally, they provide information that minimizes the expense and time of shipping samples for analysis and increases savings. The Thermo Scientific Niton XRF analyzer is a great addition to any process in the life of the mine.

News from LabRulezICPMS Library - Week 31, 2026

Article

Product

Application

Academy

Eurachem is a European network promoting international traceability of chemical measurements and good analytical practice. It provides expert guidance, supports method validation, uncertainty evaluation, proficiency testing, and facilitates discussion on technical and policy issues in analytical quality.

Eurachem

Everything from the world of analytical chemistry in one place. We connect people in solving their problems. At Labrulez you will find all the necessary information easily, quickly and clearly. Stop searching and start finding.

LabRulez

In 1936, the Laboratory Equipment Company introduced the first rapid carbon determinator for the American iron and steel industry.  Today, almost 80 years later, LECO is recognized globally as a leader in the development of high-quality analytical instrumentation, mass spectrometers, comprehensive two-dimensional chromatography, metallography & optical equipment as well as consumables.

LECO

Thermo Scientific DXR3xi Raman Imaging Microscope

High-performance Raman imaging microscope offering fast, non-destructive 2D and 3D chemical imaging with intuitive workflows, automated calibration, and advanced data visualization.

The Thermo Scientific™ DXR3xi Raman Imaging Microscope delivers research-grade Raman imaging faster than ever before. Enhanced software features combined with higher spatial resolution allow users to instantly obtain detailed visual and chemical information. Advanced imaging capabilities, minimal sample preparation, and intuitive software provide researchers with the power of Raman spectroscopy at the speed modern research demands.<h3>Key features and benefits</h3><ul><li>Simple operation suitable for users of all skill levels</li><li>Faster data visualization enabled by advanced imaging software<ul><li>Advanced particle analysis for rapid identification and analysis of microscopic contaminants</li><li>3D confocal imaging for non-destructive, non-invasive three-dimensional chemical and molecular investigations</li><li>Terrain Mapping to characterize uneven sample surfaces and easily acquire in-focus Raman images</li></ul></li><li>Intuitive workflow designed for demanding applications to maximize sample throughput</li><li>Automated calibration to improve efficiency</li><li>High measurement accuracy supported by:<ul><li>Automatic alignment and calibration with no tools required</li><li>Automatic background compensation</li></ul></li><li>Rapid system reconfiguration within seconds – pre-aligned lasers, filters, and gratings can be changed without tools</li><li>Fast spectral analysis and interpretation using powerful Thermo Scientific™ OMNIC™xi Software</li><li>Advanced autofocus and morphological analysis to track positions across uneven surfaces</li><li>Visualization tools for extracting chemical contrast and identifying and ranking features of interest</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_8_9021ee32c0.jpg" alt="Thermo Scientific DXR3xi Raman Imaging Microscope " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_8_9021ee32c0.jpg 234w," sizes="100vw" width="650" height="433"><h3>Laser safety</h3><ul><li>Microscope designed and independently certified as Class 1 laser safe</li><li>Optional fiber optic accessories and selected components are Class 3b laser devices, requiring appropriate laser safety measures and protective eyewear</li><li>Laser path is physically blocked from the visual viewing path to prevent eye exposure during observation</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_4_73e61c6ef9.jpg" alt="Thermo Scientific DXR3xi Raman Imaging Microscope " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_4_73e61c6ef9.jpg 236w," sizes="100vw" width="650" height="430"><h3>Applications</h3><ul><li>Nanotechnology</li><li>Microplastics analysis</li><li>Polymer and chemical analysis</li><li>Electronics</li><li>Materials science</li><li>Academic research</li><li>Pharmaceutical research</li><li>Geology</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_9_5d3708416c.jpg" alt="Thermo Scientific DXR3xi Raman Imaging Microscope " srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_9_5d3708416c.jpg 156w," sizes="100vw" width="650" height="650"><h3>Specifications</h3><ul><li>Electrical Requirements: 100/240 V, 47/63 Hz</li><li>Electronic Records and Signatures: 21CFR Part 11</li><li>For Use With (Application): Nanotechnology, Material science, Academic research, Pharmaceutical, Geology, Microplastics, Polymer/Chemical and Electronics</li><li>Laser Power: Fine Laser Power Control: Power controlled and reported at samples in 0.1 mW increments</li><li>Model: DXR3xi Raman Imaging Microscope</li><li>Operating Temperature Range: 16°C to 27°C</li><li>Resolution: Spatial: 0.5 µm; Confocal Depth: 2 µm</li><li>Software Details: Data analysis and spectral interpretation with powerful Thermo Scientific™ OMNIC™xi Software</li><li>Wavelength Range: 455 nm; 532 nm high brightness; 532 nm high power; 633 nm high brightness; 633 nm high power; 780 nm</li><li>Type: Raman Imaging Microscope</li><li>Unit Size: Each</li></ul>

Thermo Scientific DXR3 Raman Microscope

The Thermo Scientific DXR3 Raman Microscope is an easy-to-use confocal Raman system with automated calibration, high stability, and flexible laser options for a wide range of applications.

The Thermo Scientific™ DXR3 Raman Microscope is a modern, easy-to-use point-and-shoot Raman microscope designed to provide faster, more reliable access to Raman data than ever before. Advanced imaging capabilities combined with automated system calibration deliver exceptional stability, reproducibility, and confidence in Raman measurements—even for non-specialist users.Thanks to Automated X-axis Calibration, the DXR3 system maintains long-term accuracy and reliability while minimizing user intervention. With a flexible choice of lasers and gratings, the DXR3 Raman Microscope is ideally suited for applications across pharmaceutical research, academia, advanced polymers, microplastics, and many other demanding fields.<img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3_Raman_Microscope_6_1dd5de4a21.jpg" alt="Thermo Scientific DXR3 Raman Microscope" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3_Raman_Microscope_6_1dd5de4a21.jpg 245w," sizes="100vw" width="650" height="299"><h3>Key capabilities</h3><ul><li>New Particle Analysis functionality for rapid identification and analysis of microparticles</li><li>High-performance confocal Raman microscopy in a robust, fully integrated design</li><li>Fully automated alignment and calibration with no tools or manual procedures required</li><li>Real-time preview, automated fluorescence correction, auto-exposure, and cosmic ray rejection</li><li>System status indicator providing at-a-glance confirmation that the instrument is optimized and ready for data acquisition</li><li>Three-path fine-beam autoalignment to maintain peak performance and sampling integrity</li><li>Active laser power regulation ensuring consistent sample excitation throughout the lifetime of the laser</li><li>Advanced spectrograph design with no moving parts for simplified operation and highly robust detection and calibration</li><li>Pre-aligned, lock-in-place components with automatic recognition and stored alignment, enabling system reconfiguration in seconds</li><li>Interchangeable lasers and components shared across the DXR3 Raman family</li><li>Optional automated polarized Raman spectroscopy for structural information complementary to chemical data</li><li>Add new excitation wavelengths without tools or service engineer intervention</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3_Raman_Microscope_2_e366caa151.jpg" alt="Thermo Scientific DXR3 Raman Microscope" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3_Raman_Microscope_2_e366caa151.jpg 204w," sizes="100vw" width="631" height="483"><h3>Laser safety</h3><ul><li>Microscope independently certified as Class 1 laser safe (Note: optional fiber-optic accessories and certain other optional components are Class 3B laser devices and require appropriate laser safety precautions and eyewear)</li><li>Laser is physically blocked from the visual viewing path, preventing eye exposure during sample observation</li></ul><h3>Validation and compliance</h3><ul><li>Complete DQ/IQ/OQ/PQ validation package available, including extensive documentation and automated software protocols</li><li>OMNIC™ D/S software supports compliance with 21 CFR Part 11</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3_Raman_Microscope_3_62f6baad12.jpg" alt="Thermo Scientific DXR3 Raman Microscope" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3_Raman_Microscope_3_62f6baad12.jpg 178w," sizes="100vw" width="630" height="553"><h3>Exceptional analytical performance</h3><ul><li>Spatial resolution down to 540 nm on ideal samples</li><li>Confocal depth resolution as fine as 1.7 µm on ideal samples</li><li>Full spectral range of 3500–50 cm⁻¹ captured in a single CCD exposure, eliminating stitching artifacts</li><li>Extended spectral range up to 6000 cm⁻¹ available with the 532 nm laser</li><li>Support for multiple excitation lasers: 455, 532, 633, and 785 nm (high-brightness and high-power options)</li><li>Automatic fluorescence correction available for all excitation lasers</li><li>Research-grade Olympus viewing optics</li><li>Automatic intensity correction enabling spectral comparability between instruments and across different excitation lasers</li><li>Multidimensional wavelength calibration ensuring accurate calibration across the entire spectral range</li><li>Proprietary Triplet spectrograph delivering exceptional peak shape and maintaining focus at all wavelengths</li><li>Software-controlled switching between confocal and high-energy collection modes</li><li>Proprietary algorithms for automated cosmic ray rejection and high-quality laser line filters for artifact-free spectra</li><li>Depolarized lasers to eliminate confusing sample orientation effects</li><li>Active laser power monitoring ensures reproducible excitation power over the laser lifetime and after laser replacement</li><li>Optimized gratings for each excitation laser, avoiding performance compromises associated with shared gratings</li><li>Proprietary autoalignment maintains the system in like-new condition</li><li>Smart-Backgrounds technology automatically removes the CCD dark energy profile</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3_Raman_Microscope_5_ca01560747.jpg" alt="Thermo Scientific DXR3 Raman Microscope" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3_Raman_Microscope_5_ca01560747.jpg 210w," sizes="100vw" width="633" height="471"><h3>Recommended applications</h3><ul><li>Forensics – trace evidence analysis and illicit drug identification</li><li>Pharmaceuticals – polymorphism studies, particulate contamination, and diffusion analysis</li><li>Art restoration and conservation – identification and characterization of pigments, resins, glazes, and inks</li><li>Archaeology – characterization of horn, shell, bone, and ceramic artifacts</li><li>Solar materials – silicon crystallinity and photovoltaic material characterization</li><li>Polymers – inclusions, gel defects, weathering effects, laminate layers, and crystallinity</li><li>Failure analysis – characterization of particulates and small surface features</li><li>Gemology – rapid identification of colored stones, differentiation of natural and synthetic diamonds, characterization of inclusions and adulterants</li><li>Nanotechnology – graphene, carbon nanotubes (CNTs), DLC coatings, and other nanostructures</li><li>Academic research – materials science, biological studies, and a wide range of applied research fields</li></ul><img src="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_9_5d3708416c.jpg" alt="Thermo Scientific DXR3 Raman Microscope" srcset="https://storage.googleapis.com/labrulez-bucket-strapi-h3hsga3/thumbnail_Thermo_Scientific_DXR_3xi_Raman_Imaging_Microscope_9_5d3708416c.jpg 156w," sizes="100vw" width="650" height="650"><h3>Specification</h3><ul><li>Depth (Metric): 68 cm</li><li>Description: DXR3 Raman Microscope</li><li>Electrical Requirements: 100/240 V, 47/63 Hz</li><li>Electronic Records and Signatures: 21CFR Part 11</li><li>For Use With (Application):&nbsp;<ul><li>Pharmaceutical</li><li>Microplastics</li><li>Forensics</li><li>Polymer/Chemical</li><li>Petrochemical</li><li>Material Science</li><li>Nanomaterials</li><li>Academia</li><li>Energy Storage</li><li>Art Restoration/Conservation</li></ul></li><li>Height (Metric): 61 cm</li><li>Laser Power: Fine Laser Power Control: Power controlled and reported at samples in 0.1 mW increments</li><li>Model: DXR3</li><li>Operating Temperature Range: 16°C to 27 °C</li><li>Resolution:&nbsp;<ul><li>Spatial: 1 µm</li><li>Confocal Depth: 2 µm</li></ul></li><li>Wavelength Range:&nbsp;<ul><li>455 nm</li><li>532 nm high brightness</li><li>532 nm high power</li><li>633 nm high brightness</li><li>633 nm high power</li><li>780 nm</li></ul></li><li>Weight (Metric): 66.5 kg</li><li>Width (Metric): 94 cm</li><li>Type: Microscope</li><li>Unit Size: Each</li></ul>

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