Investigation of ceramic materials in 5G Antenna development with ARL EQUINOX 100 XRD and QUANT’X EDXRF

Importance of the Topic

As wireless data rates rise, the underused spectrum above 10 GHz is targeted for 5G, demanding antenna ceramics with stable, low dielectric constants and high quality factors. Precise chemical and structural control of these materials ensures reliable performance and narrow bandwidth in high-frequency applications.

Goals and Study Overview

This study demonstrates a combined X-ray diffraction (XRD) and energy-dispersive X-ray fluorescence (EDXRF) approach to:

• Identify and quantify crystalline phases in 5G antenna ceramics
• Determine elemental composition and detect trace dopants
• Validate the agreement between phase and elemental analyses for quality control

Used Instrumentation

The analysis employed:

• ARL EQUINOX 100 XRD system with curved position-sensitive detector and micro-focus X-ray source (Cu Kα, 50 W) for rapid, real-time diffraction
• ARL QUANT’X EDXRF spectrometer with Rh-anode tube (50 W) and silicon drift detector for element detection from Na to U and standard-less quantification

Methodology

The ceramic sample was milled to fine powder and measured in reflection geometry on the ARL EQUINOX 100 for 13 minutes. Phase identification and weight-percent quantification used Whole Pattern Fitting (WPF) in MDI JADE 2010 with the pdf4+ database. Elemental concentrations were derived from EDXRF spectra via Fundamental Parameters modeling.

Main Results and Discussion

XRD revealed a multiphase mixture dominated by geikielite (MgTiO₃, ~83 wt %) alongside perovskite (CaTiO₃, ~6 wt %), two Mg₂SiO₄ polymorphs (wadsleyite and forsterite, ~4–5 wt % each) and minor corundum (~2 wt %). EDXRF quantified TiO₂ (~57 wt %), MgO (~34 wt %), CaO (~3.3 wt %), SiO₂ and Al₂O₃ (~2.5 wt % each), with trace Zr, Nb, Ni and other dopants below 0.4 wt %. Agreement between phase-based XRD and oxide-based EDXRF validated the combined approach.

Benefits and Practical Applications

• Rapid, non-destructive QC/QA of 5G antenna ceramics
• Accurate phase quantification supporting dielectric property optimization
• Trace element monitoring to control dopants and contaminants
• Ease of use suitable for both industrial production and academic research

Future Trends and Opportunities

Advances may include:

• In situ high-temperature XRD to study phase stability under operating conditions
• Automated workflows integrating XRD, EDXRF and dielectric measurements for real-time process control
• Machine-learning-driven interpretation of complex diffraction and fluorescence datasets
• Extension to novel composition spaces, such as low-loss perovskite derivatives and composite ceramics

Conclusion

The combined use of ARL EQUINOX 100 XRD and QUANT’X EDXRF provides a fast, reliable workflow for comprehensive characterization of 5G antenna ceramics. Phase and elemental analyses correlate well, enabling rigorous quality control and guiding material optimization for high-frequency wireless applications.