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Fast, Effective XPS Point Analysis of Metal Components

Applications | 2012 | Thermo Fisher ScientificInstrumentation
X-ray
Industries
Materials Testing
Manufacturer
Thermo Fisher Scientific

Summary

Importance of the Topic


XPS point analysis allows localized chemical state analysis of metal surfaces, critical for understanding corrosion, contamination and surface treatments in industrial and research settings. By enabling targeted investigation of visually distinct regions, this method supports quality control and failure analysis in aerospace, automotive and materials science.

Study Aims and Overview


This application note demonstrates the use of the Thermo Scientific K-Alpha XPS system to identify and quantify chemical variations on a tarnished aluminum component. The goal is to correlate surface discoloration with underlying chemical states across shiny, grey and brown areas.

Methodology and Instrumentation


  • Sample Preparation: Aluminum component mounted on a 60 × 60 mm platter with spring clips; latex gloves used to avoid contamination.
  • Instrument: Thermo Scientific K-Alpha XPS system controlled by Avantage software with live optical camera for navigation and “point-and-shoot” operation.
  • Analysis Workflow: Optical mapping of sample platter, insertion of point analysis spots by clicking on optical view, adjustment of X-ray spot size.
  • Spectrum Acquisition: Use of Multi-spectrum insert tool to collect survey scans for elemental identification followed by high-resolution region scans for selected elements.
  • Data Processing: Automated Survey ID for elemental fingerprinting, peak integration or deconvolution for chemical state quantification, oxide thickness estimation via two-layer model.

Key Results and Discussion


  • Survey Quantification: Shiny and grey areas exhibit similar chemistry (Al₂O₃ ~21 at.%, O ~45–51 at.%), low Fe and Zn content.
  • Brown Area Differences: Elevated Fe₂O₃ (~10 at.%) and ZnO (~0.8 at.%), indicating surface oxide growth and contamination layer formation.
  • Substrate Attenuation: Surface iron oxide attenuates aluminum signal; thickness estimated at ~1.5 nm using Avantage two-layer model.
  • Surface Discoloration: Correlated increased iron and zinc oxides to observed brown tarnish, identifying corrosion products responsible for component failure.

Benefits and Practical Applications


  • Rapid Local Analysis: Point-and-shoot interface and automated tools enable fast, user-friendly surface characterization without extensive expertise.
  • Quantitative Insight: Accurate elemental and chemical state quantification supports failure analysis, coating evaluation and process control.
  • Adaptability: Customizable X-ray spot size and automated experiment setup (Auto-Analysis) for multiple sample points streamline routine inspections.

Future Trends and Applications


  • Enhanced Automation: Integration of AI-driven experiment planning and real-time data interpretation to further reduce operator involvement.
  • Correlative Microscopy: Combining XPS with optical, electron or ion beam techniques for multi-modal surface characterization.
  • Industry Adoption: Expanded use in quality assurance for advanced alloys, thin films, semiconductor device manufacturing and environmental corrosion studies.

Conclusion


The Thermo Scientific K-Alpha XPS system provides a robust platform for fast and effective point analysis of metal components. Its intuitive software, coupled with integrated analytical tools, enables precise surface chemical state mapping and oxide thickness measurement, facilitating informed decision-making in research and industrial applications.

Content was automatically generated from an orignal PDF document using AI and may contain inaccuracies.

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