Shimadzu OneSight Wide-Range High-Speed Detector for XRD-6100/7000

Importance of the Topic

A rapid, high-sensitivity X-ray detector significantly enhances throughput and data quality in X-ray diffraction (XRD) applications. The OneSight wide-range, high-speed detector brings semiconductor-based detection to routine powder and phase analysis, reducing measurement times while maintaining or improving signal intensity. Its deployment on existing XRD-6100/7000 instruments streamlines quantitative and qualitative analyses in materials science, pharmaceuticals, geology and industrial QA/QC laboratories.

Objectives and Overview of the Detector System

This application note introduces Shimadzu’s OneSight wide-range high-speed detector (model FD-1002) for the XRD-6100/7000 series. Key aims include:

• Presenting the detector’s performance advantages over conventional scintillation detectors.
• Describing software interface enhancements for measurement control.
• Demonstrating throughput gains via simultaneous wide-angle acquisition modes.

Methodology and Used Instrumentation

OneSight integrates 1,280 individual semiconductor channels into a linear array covering 64 × 8 mm. Its core features include:

• High-speed data acquisition without mechanical scanning of the goniometer.
• Three selectable measurement modes: High Resolution (10× faster), Standard (15× faster), and Fast (25× faster) relative to a single-channel scintillation detector.
• ONE SHOT mode for simultaneous capture of diffraction profiles over >10° 2θ range.

The measurement software employs a refreshed user interface: the central panel displays the analysis profile and schedule, the left panel shows condition lists and machine status, and the right panel provides detailed condition editing. Users can rearrange these panels to suit workflow preferences.

Main Results and Discussion

Comparative tests using a silicon standard demonstrate one-order-of-magnitude faster acquisitions across all modes. The detector’s array format allows a full diffraction pattern to be recorded in a single measurement, eliminating the need for step-scan routines. In quantitative asbestos analysis (chrysotile), 30-second acquisitions at various mass loadings (0.1–5 mg) yielded distinct, high-signal peaks suitable for reliable phase quantification.

Practical Benefits and Applications

The OneSight detector offers several practical advantages:

• Substantially reduced measurement time, enabling higher sample throughput and faster decision-making.
• Enhanced sensitivity (>100× increase in detected intensity), improving detection limits for minor phases.
• User-friendly software layout, accelerating method setup and real-time monitoring.
• Compatibility with existing XRD-6100/7000 installations after initial parameter setup and optional software/hardware updates.

Future Trends and Applications

Next-generation trends in XRD detection include further miniaturization of semiconductor arrays, integration with robotics for automated sample handling, and application of machine learning for real-time phase identification. Expanding detector coverage and coupling with in situ environmental chambers will broaden OneSight’s use in dynamic studies of phase transformations, thin films and battery materials.

Conclusion

Shimadzu’s OneSight wide-range high-speed detector transforms conventional XRD workflows by delivering rapid, high-intensity data across a broad angular range without mechanical scanning. Its high channel count and versatile modes satisfy the growing demand for accelerated quantitative and qualitative analyses, meeting the needs of modern research and industrial laboratories.

Used Instrumentation

• Detector: OneSight Wide-Range High-Speed Detector (FD-1002 1D High-Speed Detector, P/N 215-24320-93)
• Instrument: Shimadzu XRD-6100/7000 X-ray Diffractometer
• Active Detection Area: 64 × 8 mm, 1280 channels
• Detector Dimensions: W70 × D22 × H62 mm

References

None provided in original document