Agilent 5800 ICP-OES
Brochures and specifications | 2025 | Agilent TechnologiesInstrumentation
Inductively coupled plasma optical emission spectroscopy (ICP-OES) plays a critical role in elemental analysis across environmental, industrial, and research laboratories. By combining sensitivity, multi-element capability, and throughput, modern ICP-OES systems address strict regulatory demands, quality control needs, and complex matrix challenges.
This summary reviews the features of the Agilent 5800 ICP-OES platform, highlighting how embedded sensors, intelligent software, and integrated workflows reduce sample remeasurements, minimize maintenance downtime, and improve analytical confidence.
Agilent 5800 provides two configurations: Vertical Dual View (VDV) upgradeable to Synchronous VDV and Radial View (RV) for high-sensitivity analyses. Key smart features include:
Optional automation accessories such as the SPS 4 autosampler, Advanced Valve System (AVS), Advanced Dilution System (ADS 2), Multimode Sample Introduction System (MSIS), and Agilent CrossLab integration extend throughput and reliability.
Implementation of the 5800’s smart ecosystem can reduce sample remeasurements (laboratory polls report averages of 15% remeasurement rates) and eliminate up to 30% of unnecessary service calls. IntelliQuant’s spectral mapping flags interferences (for example, arsenic interference on Cd 228.802 nm) and alerts users to sample preparation errors such as missing acid additions.
By providing real-time insights into sample composition, spectral health, and instrument status, the 5800 enhances data integrity and laboratory efficiency. Applications include environmental monitoring, agriculture testing (case study: AgSource Laboratories), QA/QC in pharmaceutical and food industries, and high-matrix industrial analyses.
Advancements in machine learning algorithms for spectral deconvolution, increased integration of laboratory informatics, and expansion of automation workflows will drive further gains in throughput and data quality. Further miniaturization and cloud-based diagnostics could enable remote monitoring and predictive maintenance at scale.
The Agilent 5800 ICP-OES platform leverages smart hardware, software, and automation to deliver reliable, high-throughput elemental analysis while reducing downtime, maintenance costs, and data uncertainty. Its integrated approach makes it a versatile solution for modern laboratories facing diverse analytical challenges.
ICP-OES
IndustriesManufacturerAgilent Technologies
Summary
Importance of the Topic
Inductively coupled plasma optical emission spectroscopy (ICP-OES) plays a critical role in elemental analysis across environmental, industrial, and research laboratories. By combining sensitivity, multi-element capability, and throughput, modern ICP-OES systems address strict regulatory demands, quality control needs, and complex matrix challenges.
Objectives and Overview
This summary reviews the features of the Agilent 5800 ICP-OES platform, highlighting how embedded sensors, intelligent software, and integrated workflows reduce sample remeasurements, minimize maintenance downtime, and improve analytical confidence.
Methodology and Instrumentation
Agilent 5800 provides two configurations: Vertical Dual View (VDV) upgradeable to Synchronous VDV and Radial View (RV) for high-sensitivity analyses. Key smart features include:
- Embedded sensors and diagnostics for proactive troubleshooting and preemptive maintenance
- IntelliQuant for simultaneous full-spectrum scanning and concentration estimates of up to 70 elements, spectral interference detection, and wavelength recommendations
- Fitted background correction (FBC) and Fast Automated Curve-fitting Technique (FACT)/Inter Element Correction (IEC) algorithms for spectral corrections
- Traffic-light maintenance counters, built-in performance tests, and self-diagnostic electronics
Optional automation accessories such as the SPS 4 autosampler, Advanced Valve System (AVS), Advanced Dilution System (ADS 2), Multimode Sample Introduction System (MSIS), and Agilent CrossLab integration extend throughput and reliability.
Main Results and Discussion
Implementation of the 5800’s smart ecosystem can reduce sample remeasurements (laboratory polls report averages of 15% remeasurement rates) and eliminate up to 30% of unnecessary service calls. IntelliQuant’s spectral mapping flags interferences (for example, arsenic interference on Cd 228.802 nm) and alerts users to sample preparation errors such as missing acid additions.
Benefits and Practical Applications
By providing real-time insights into sample composition, spectral health, and instrument status, the 5800 enhances data integrity and laboratory efficiency. Applications include environmental monitoring, agriculture testing (case study: AgSource Laboratories), QA/QC in pharmaceutical and food industries, and high-matrix industrial analyses.
Future Trends and Applications
Advancements in machine learning algorithms for spectral deconvolution, increased integration of laboratory informatics, and expansion of automation workflows will drive further gains in throughput and data quality. Further miniaturization and cloud-based diagnostics could enable remote monitoring and predictive maintenance at scale.
Conclusion
The Agilent 5800 ICP-OES platform leverages smart hardware, software, and automation to deliver reliable, high-throughput elemental analysis while reducing downtime, maintenance costs, and data uncertainty. Its integrated approach makes it a versatile solution for modern laboratories facing diverse analytical challenges.
Used Instrumentation
- Agilent 5800 ICP-OES (VDV/SVDV and RV configurations)
- IntelliQuant spectral analytics
- SPS 4 autosampler
- Advanced Valve System (AVS)
- Advanced Dilution System (ADS 2)
- Multimode Sample Introduction System (MSIS)
- Optional recirculating chiller
References
- United States Environmental Protection Agency. OTS Alert #2: False-positive detections using ICP-AES (2001).
- Chapnick, S. D., Pitts, L. C., Rothman, N. C. Arsenic and Thallium Data in Environmental Samples: Fact or Fiction? Remediation (2010).
Content was automatically generated from an orignal PDF document using AI and may contain inaccuracies.
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