Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin filmsApplications | 2011 | Agilent Technologies InstrumentationUV–VIS spectrophotometryIndustriesMaterials TestingManufacturerAgilent TechnologiesKey wordsreflectance, films, sra, constants, aluminum, optical, specular, accessory, cary, displacement, misalignment, thin, beam, alignment, mirrors, plane, reflecting, rotation, undergoes, absorbing, sample, crystal, mirror, photometric, roughness, shims, film, rotations, coated, wales, reflectivity, tests, stuart, absolute, region, front, reflections, symmetrically, wavelength, rotated, wafers, from, measure, effect, preferable, surface, polished, visibility, unaffected, assumes
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Agilent Cary 4000/5000/6000i Series UV-VIS-NIR Spectrophotometers
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Unrivaled.Precise. Consistent.Agilent Cary 4000/5000/6000i SeriesUV-VIS-NIR SpectrophotometersUnrivaledAgilent is your premier resource and partner for molecularspectroscopy. The world-renowned Cary product line,encompasses FTIR, UV-Vis-NIR and Fluorescence, offering youa comprehensive range of molecular spectroscopy solutions.Answers you can trustThe Cary 4000/5000/6000i Series UV-Vis-NIR spectrophotometers are...
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Application NoteMaterialsOptical Characterization of Thin FilmsUsing a Universal Measurement Accessory forAgilent Cary UV-Vis-NIR spectrophotometersAuthorsRobert Francis and Travis BurtAgilent Technologies, Inc.Mulgrave, VictoriaAustraliaIntroductionA more detailed account of this work was first published in Applied Optics,10 January 2012/Vol. 51, No. 2.1The accurate determination...
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Application NoteMaterialsGaining Deeper Insights into ThinFilm ResponseOvercoming spectral oscillations using theAgilent Cary universal measurement accessoryAuthorsRobert Francis and Travis BurtAgilent Technologies, Inc.Mulgrave, VictoriaAustraliaIntroductionA more detailed account of this work was first published in Optics Express 16129,2 July 2012, Vol. 20, No....
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Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
2023|Agilent Technologies|Applications
Application NoteMaterialsEvaluation of the Cary AbsoluteSpecular Reflectance Accessoryfor the Measurement of OpticalConstants of Thin FilmsAuthorStuart WhitePhysics Department,Sydney University, Sydney,New South WalesAbstractThe optical constants of thin absorbing films can be determined using photometry,in which the transmittance (T) and the reflectance from...
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