Single particle analysis of nanomaterials with agilent ICP-MS (RAFA)
Postery | 2013 | Agilent Technologies | RAFAInstrumentation
ICP/MS
IndustriesPotraviny a zemědělství
ManufacturerAgilent Technologies
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Single particle analysis of nanomaterials with agilent ICP-MS
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Single particle analysis of nanomaterials with agilent ICP-MS Sébastien Sannac, Agilent Technologies, France Introduction Nanoparticles (NPs) are defined as ultrafine particles with one dimension between 1–100 nm [1]. Because of their small size, they have a very large surface area…
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Single particle analysis using the Agilent 7700x ICP-MS
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Single particle analysis using the Agilent 7700x ICP-MS Application note Materials Authors Sébastien Sannac1, Soheyl Tadjiki2, Evelin Moldenhauer3 1 Agilent Technologies, France Postnova Analytics Inc., UT, USA 3 Postnova Analytics GmbH, Landsberg, Germany 2 Introduction Nanoparticles (NPs) are defined as…
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Agilent ICP-MS Journal (August 2013 – Issue 54)
2013|Agilent Technologies|Others
Agilent ICP-MS Journal August 2013 – Issue 54 Inside this Issue 2-3 New Revision of ICP-MS MassHunter, Agilent Compliance Software Options, and USP<232> 4-5 User article: Speciation of Aluminum Fluoride Complexes and Al3+ in Environmental Samples using HPLC-ICP-MS 5 Tips…
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Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module
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Automated, high sensitivity analysis of single nanoparticles using the Agilent 7900 ICP-MS with Single Nanoparticle Application Module Application note Materials, environmental Authors Michiko Yamanaka, Kazuo Yamanaka and Takayuki Itagaki Agilent Technologies, Japan Steven Wilbur Agilent Technologies, USA Ed McCurdy Agilent…
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