Library | LabRulez ICPMS

Optical Characteristics and Thickness of 2-layered Structures

Applications

| 2018 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

EDXRF Analysis of Polymer Film

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Applications

| 2018 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Void Analysis and Shape Analysis of Automobile Inverter Components with X-Ray CT System

Applications

| 2023 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample

Applications

| 2021 | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Direct Identification of Packaged Substances using the Agilent Resolve Handheld Raman Analyzer

Applications

| 2023 | Agilent Technologies

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Agilent Technologies

Industries

Forensics

Molecular Spectroscopy Application eHandbook

Guides

| 2017 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing

Gaining Deeper Insights into Thin Film Response

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Optical Characteristics and Thickness of 2-layered Structures

The determination of thin film thickness using reflectance spectroscopy

EDXRF Analysis of Polymer Film

Quantitative Analysis of Film Thicknesses of Multi-Layer Plating Used on Cards

Void Analysis and Shape Analysis of Automobile Inverter Components with X-Ray CT System

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Quantitative Analysis of Amount of Deposition and Plating Thickness: Multilayer and Irregular Shaped Sample

Direct Identification of Packaged Substances using the Agilent Resolve Handheld Raman Analyzer

Molecular Spectroscopy Application eHandbook

Gaining Deeper Insights into Thin Film Response

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