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Analysis of trace metallic impurities in hydrocarbon fuels by ICP-MS
Applications
| 2013 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS
Applications
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS
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| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
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Agilent Technologies
Industries
Semiconductor Analysis
Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS
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| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Direct Analysis of Trace Metallic Impurities in High Purity Hydrochloric Acid by 7700s/7900 ICP-MS
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| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS
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| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
WCPS: Efficient Removal of Polyatomic Ions by ICP-MS Equipped with Novel Reaction Cell: Examples of Highly Purified Chemicals Used for Semiconductor
Posters
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
Technical notes
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
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Agilent Technologies
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Semiconductor Analysis
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