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Linearity Limits for Several Trace Metals Currently Determined by Electrothermal Atomic Absorption Spectrometry
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Determination of the oxidation reduction potential of bacterial reaction centers
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Clinical Research
EDXRF Analysis of Polymer Film
Applications
| N/A | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
The TOC-4100 in wastewater treatment plants
Others
| 2001 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Environmental
Rare Earth Element Determination in Geological Samples Using the Agilent SVDV ICP‑OES
Applications
| 2021 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Environmental
Quantitative analysis of tint in polymer pellets and disks
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Optimizing GFAAS Ashing and Atomizing Temperatures using Surface Response Methodology
Technical notes
| 2018 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS
Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike