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    Waldner Secuflow EN7

    Brochures and specifications
    | 2018 | Waldner
    Instrumentation
    Manufacturer
    Industries

    Cary 7000 Universal Measurement System (UMS) – Site Preparation Checklist

    Manuals
    | 2016 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    ESAS & CANAS 2018 - Programm

    Others
    | 2018 | ESAS
    Instrumentation
    Manufacturer
    Industries

    Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

    Technical notes
    | 2013 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Agilent Cary 7000 universal measurement spectrophotometer

    Brochures and specifications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    High Volume Optical Component Testing

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Spectrophotometric Spatial Profiling of Coated Optical Wafers

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Quality Control of Beam Splitters and Quarter-Wave-Mirrors

    Technical notes
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Rapid, Automated, Quality Control Measurements of Diffraction Grating Efficiency

    Applications
    | 2018 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing
     

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