Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
Applications
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
Applications
| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Reliable Analysis of the Light Ends of Petroleum Fractions and Crude Oil Using Capillary Flow Backflush Technology